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Interferometric metrology : 20-21, August 1987, San Diego, California

Author: N A Massie; New Mexico State University. Applied Optics Laboratory.
Publisher: Bellingham, Wash. : SPIE--the International Society for Optical Engineering, ©1988.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 816.; Critical reviews of optical science and technology.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
Interferometric metrology.
Bellingham, Wash. : SPIE--the International Society for Optical Engineering, ©1988
(OCoLC)18656084
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: N A Massie; New Mexico State University. Applied Optics Laboratory.
ISBN: 0892528516 9780892528516
OCLC Number: 574211026
Reproduction Notes: Electronic reproduction. [S.l.] : HathiTrust Digital Library, 2010. MiAaHDL
Description: 1 online resource (vi, 239 pages) : illustrations.
Details: Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 816.; Critical reviews of optical science and technology.
Responsibility: sponsored by SPIE ; cooperating organizations: Applied Optics Laboratory, New Mexico State University [and others] ; editor, N.A. Massie.

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