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Interferometry--surface characterization and testing : 24 July 1992, San Diego, California

Author: Katherine Creath; John E Greivenkamp; Society of Photo-optical Instrumentation Engineers.
Publisher: Bellingham, Wash. : SPIE, ©1992.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 1776.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Conference papers and proceedings
Additional Physical Format: Online version:
Interferometry. Surface characterization and testing.
Bellingham, Wash. : SPIE, ©1992
(OCoLC)624401428
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Katherine Creath; John E Greivenkamp; Society of Photo-optical Instrumentation Engineers.
ISBN: 0819409499 9780819409492
OCLC Number: 27255547
Description: vii, 183 p. : ill. ; 28 cm.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 1776.
Responsibility: Katherine Creath, John E. Greivenkamp, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

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