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Internal Photoemission Spectroscopy : Fundamentals and Recent Advances

Author: Valery V Afanasʹev
Publisher: Amsterdam : Elsevier, 2014.
Edition/Format:   eBook : Document : EnglishView all editions and formats
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Genre/Form: Electronic books
Additional Physical Format: Print version:
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Valery V Afanasʹev
ISBN: 1306470285 9781306470285 9780080999302 0080999301
OCLC Number: 871639515
Description: 1 online resource
Contents: 1. Introduction2. Internal versus External Photoemission3. Photoemission into Insulators: Physical Model4. Internal Photoemission Spectroscopy Methods5. Injection and monitoring of charge trapping phenomena6. Analysis of charge trapping kinetics and transport-related effects7. Silicon-Insulator Interface Barriers8. Interface Barriers of Wide-Gap and High-Mobility Semiconductors9. Electron Energy Barriers Between Conducting and Insulating Materials10. Conclusions
Responsibility: Valery V. Afanasʹev.

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