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International Symposium on Photoelectronic Detection and Imaging 2009. Advances in infrared imaging and applications : 17-19 June 2009, Beijing China

Author: Jeffery John Puschell; China Aerospace Science and Industry Corporation. Tianjin Jinhang Institute of Technical Physics.; Zhongguo yu hang xue hui. Photoelectric Technology Professional Committee.; SPIE (Society)
Publisher: Bellingham, Wash. : SPIE, ©2009.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 7383.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
International Symposium on Photoelectronic Detection and Imaging (2009 : Beijing, China).
International Symposium on Photoelectronic Detection and Imaging 2009. Advances in infrared imaging and applications.
Bellingham, Wash. : SPIE, ©2009
(OCoLC)444747435
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Jeffery John Puschell; China Aerospace Science and Industry Corporation. Tianjin Jinhang Institute of Technical Physics.; Zhongguo yu hang xue hui. Photoelectric Technology Professional Committee.; SPIE (Society)
OCLC Number: 446008183
Description: 1 online resource (2 volumes) : illustrations (some color).
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 7383.
Other Titles: ISPDI 2009 :
Advances in infrared imaging and applications
Responsibility: Jeffery Puschell [and others], editors ; organized by Tianjin Jinhang Institute of Technical Phyiscs, CASIC (China) ; sponsored by Photoelectric Technology Professional Committee, Chinese Society of Astronautics (China).

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