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International Test Conference 2003 : proceedings.

Author: IEEE Computer Society. Technical Council on Test Technology.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: Washington, D.C. : International Test Conference, ©2003.
Edition/Format:   eBook : Document : Conference publication : English
Database:WorldCat
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: IEEE Computer Society. Technical Council on Test Technology.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
ISBN: 0780381068 9780780381063
OCLC Number: 54817313
Notes: Conference held on Sept. 30-Oct. 2, 2003, in Charlotte Convention Center, Charlotte, NC.
Sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section.
"IEEE Catalog Number 03CH37494"--Title page verso.
Description: 1 online resource : illustrations
Contents: [v. 2] Board and system test track.
Other Titles: Test Conference, 2003, Proceedings, ITC 2003, International.
ITC International Test Conference 2003

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