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International Test Conference 2008 : proceedings : October 26-October 31, 2008, Santa Clara Convention Center, Santa Clara, California, USA

Author: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: Washington, D.C. : International Test Conference, ©2008.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
OCLC Number: 450227998
Notes: Title from PDF cover (IEEE Xplore, viewed Oct. 6, 2009).
IEEE catalog number: CFP081TC-CDR.
Description: 1 online resource : illustrations
Other Titles: Test Conference, 2008, ITC 2008, IEEE International
IEEE International Test Conference, 2008
ITC 2008
Responsibility: sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section.

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