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Ion beam analysis of surfaces and interfaces of condensed matter systems

Publisher: New York : Nova Science Publishers, ©2003.
Edition/Format:   Print book : EnglishView all editions and formats
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Document Type: Book
ISBN: 1590335384 9781590335383
OCLC Number: 50809209
Description: x, 445 pages : illustrations ; 27 cm
Contents: Application of Low Energy Ion Scattering to Alloy Surfaces and Surface Alloys / D. J. O'Connor --
"Direct Recoil and Ion Scattering Spectrometries as Probes of Liquid Surfaces." / Michael Tassotto and Philip R. Watson --
New Trends in Rutherford Backscattering Spectrometry / Emile J. Knystautas --
RBS and Channeling Analysis of Self-Assembled Structures / B. N. Dev --
ERDA: A Tool for Surface and Near-Surface Studies / Devesh Kumar Avasthi and Walter Assmann --
Light Emission from Sputtered Particles / Chin Shuang Lee --
Dynamic Secondary Ion Mass Spectrometry for Compositional Analysis of Interfaces / Purushottam Chakraborty --
Surface Analysis with Slow, Highly Charged Ions like Au[superscript 69+]: TOF-SIMS and the Probing of Nano-Environments / Thomas Schenkel --
Application of Low Energy Ions to Modify Multilayer Systems for Improved X-ray Reflectivity / J. Verhoeven --
Bombardment-Induced Topography on Semiconductor Surfaces / Johan B. Malherbe --
High Energy Ion Implication in GaAs: Optical, Electrical and X-ray Investigations / Y. P. Ali, A. R. Damle, Geeta P. Nair, A. M. Narsale, K. S. Chandrasekaran and B. M. Arora.
Responsibility: Purushottam Chakraborty (editor).

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Primary Entity

<http://www.worldcat.org/oclc/50809209> # Ion beam analysis of surfaces and interfaces of condensed matter systems
    a schema:CreativeWork, schema:Book ;
   library:oclcnum "50809209" ;
   library:placeOfPublication <http://dbpedia.org/resource/New_York_City> ; # New York
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nyu> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/364503406#Topic/condensed_matter_surfaces_analysis> ; # Condensed matter--Surfaces--Analysis
   schema:about <http://id.worldcat.org/fast/978567> ; # Ion bombardment
   schema:about <http://id.loc.gov/authorities/subjects/sh85067792> ; # Ion bombardment
   schema:about <http://experiment.worldcat.org/entity/work/data/364503406#Topic/matiere_condensee_surfaces_analyse> ; # Matière condensée--Surfaces--Analyse
   schema:about <http://experiment.worldcat.org/entity/work/data/364503406#Topic/kondensierte_materie> ; # Kondensierte Materie
   schema:about <http://experiment.worldcat.org/entity/work/data/364503406#Topic/bombardement_ionique> ; # Bombardement ionique
   schema:about <http://experiment.worldcat.org/entity/work/data/364503406#Topic/oberflachenanalyse> ; # Oberflächenanalyse
   schema:about <http://experiment.worldcat.org/entity/work/data/364503406#Topic/ionenstrahlanalyse> ; # Ionenstrahlanalyse
   schema:about <http://dewey.info/class/530.417/e21/> ;
   schema:bookFormat bgn:PrintBook ;
   schema:copyrightYear "2003" ;
   schema:datePublished "2003" ;
   schema:description "Application of Low Energy Ion Scattering to Alloy Surfaces and Surface Alloys / D. J. O'Connor -- "Direct Recoil and Ion Scattering Spectrometries as Probes of Liquid Surfaces." / Michael Tassotto and Philip R. Watson -- New Trends in Rutherford Backscattering Spectrometry / Emile J. Knystautas -- RBS and Channeling Analysis of Self-Assembled Structures / B. N. Dev -- ERDA: A Tool for Surface and Near-Surface Studies / Devesh Kumar Avasthi and Walter Assmann -- Light Emission from Sputtered Particles / Chin Shuang Lee -- Dynamic Secondary Ion Mass Spectrometry for Compositional Analysis of Interfaces / Purushottam Chakraborty -- Surface Analysis with Slow, Highly Charged Ions like Au[superscript 69+]: TOF-SIMS and the Probing of Nano-Environments / Thomas Schenkel -- Application of Low Energy Ions to Modify Multilayer Systems for Improved X-ray Reflectivity / J. Verhoeven -- Bombardment-Induced Topography on Semiconductor Surfaces / Johan B. Malherbe -- High Energy Ion Implication in GaAs: Optical, Electrical and X-ray Investigations / Y. P. Ali, A. R. Damle, Geeta P. Nair, A. M. Narsale, K. S. Chandrasekaran and B. M. Arora."@en ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/364503406> ;
   schema:inLanguage "en" ;
   schema:name "Ion beam analysis of surfaces and interfaces of condensed matter systems"@en ;
   schema:productID "50809209" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/50809209#PublicationEvent/new_york_nova_science_publishers_2003> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/364503406#Agent/nova_science_publishers> ; # Nova Science Publishers
   schema:workExample <http://worldcat.org/isbn/9781590335383> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/50809209> ;
    .


Related Entities

<http://dbpedia.org/resource/New_York_City> # New York
    a schema:Place ;
   schema:name "New York" ;
    .

<http://experiment.worldcat.org/entity/work/data/364503406#Agent/nova_science_publishers> # Nova Science Publishers
    a bgn:Agent ;
   schema:name "Nova Science Publishers" ;
    .

<http://experiment.worldcat.org/entity/work/data/364503406#Topic/bombardement_ionique> # Bombardement ionique
    a schema:Intangible ;
   schema:name "Bombardement ionique"@fr ;
    .

<http://experiment.worldcat.org/entity/work/data/364503406#Topic/kondensierte_materie> # Kondensierte Materie
    a schema:Intangible ;
   schema:name "Kondensierte Materie"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/364503406#Topic/matiere_condensee_surfaces_analyse> # Matière condensée--Surfaces--Analyse
    a schema:Intangible ;
   schema:name "Matière condensée--Surfaces--Analyse"@fr ;
    .

<http://experiment.worldcat.org/entity/work/data/364503406#Topic/oberflachenanalyse> # Oberflächenanalyse
    a schema:Intangible ;
   schema:name "Oberflächenanalyse"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh85067792> # Ion bombardment
    a schema:Intangible ;
   schema:name "Ion bombardment"@en ;
    .

<http://id.worldcat.org/fast/978567> # Ion bombardment
    a schema:Intangible ;
   schema:name "Ion bombardment"@en ;
    .

<http://worldcat.org/isbn/9781590335383>
    a schema:ProductModel ;
   schema:isbn "1590335384" ;
   schema:isbn "9781590335383" ;
    .


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