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ITC International Test Conference 2006 : proceedings : October 24-October 26, 2006, Santa Clara Convention Center, Santa Clara, California USA

Author: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: Washington, D.C. : International Test Conference, ©2006.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Congres
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
ISBN: 1424402921 9781424402922
OCLC Number: 156956326
Notes: Cover title.
"IEEE Catalog Number 06CH37787"--Copyright page.
Description: 1 online resource (1 volume (various pagings)) : illustrations (some color)
Other Titles: Test Conference, 2006. ITC '06. IEEE International.
ITC '06.
International Test Conference 2006
Responsibility: sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section.

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