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JMFA 2--a graphically interactive Java program that fits microfibril angle x-ray diffraction data

Author: S P Verrill; David E Kretschmann; Victoria L Herian; Forest Products Laboratory (U.S.)
Publisher: Madison, WI : U.S. Dept. of Agriculture, Forest Service, Forest Products Laboratory, [2006]
Series: Research paper FPL-RP, 635.
Edition/Format:   Print book : National government publication : EnglishView all editions and formats
Database:WorldCat
Summary:
X-ray diffraction techniques have the potential to decrease the time required to determine microfibril angles dramatically. In this paper, we discuss the latest version of a curve-fitting toll that permits us to reduce the time required to evaluate MFA X-ray diffraction patterns. Further, because this tool reflects the underlying physics more accurately than existing tools, we expect it to yield more accurate  Read more...
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Additional Physical Format: Verrill, S.P.
JMFA 2--a graphically interactive Java program that fits microfibril angle x-ray diffraction data
70 p.
(OCoLC)122257628
Online version:
Verrill, S.P.
JMFA 2--a graphically interactive Java program that fits microfibril angle x-ray diffraction data.
Madison, WI : U.S. Dept. of Agriculture, Forest Service, Forest Products Laboratory, [2006]
(OCoLC)624416096
Material Type: Government publication, National government publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: S P Verrill; David E Kretschmann; Victoria L Herian; Forest Products Laboratory (U.S.)
OCLC Number: 76704700
Notes: Cover title.
"July 2006"--Page 2 of cover.
Description: 70 pages : illustrations ; 28 cm.
Series Title: Research paper FPL-RP, 635.
Other Titles: Graphically interactive Java program that fits microfibril angle x-ray diffraction data
Responsibility: Steve P. Verrill, David E. Kretschmann, Victoria L. Herian.

Abstract:

X-ray diffraction techniques have the potential to decrease the time required to determine microfibril angles dramatically. In this paper, we discuss the latest version of a curve-fitting toll that permits us to reduce the time required to evaluate MFA X-ray diffraction patterns. Further, because this tool reflects the underlying physics more accurately than existing tools, we expect it to yield more accurate estimates of MFA.

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