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JMP, release 9 : modeling and multivariate methods.

Author: SAS Publishing Co.
Publisher: Cary, N.C. : SAS Institute, 2010.
Edition/Format:   eBook : Document : English
Database:WorldCat
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Genre/Form: Electronic books
Handbooks and manuals
Handbooks, manuals, etc
Additional Physical Format: Print version:
JMP, release 9.
Cary, N.C. : SAS Institute, 2010
(OCoLC)670481790
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: SAS Publishing Co.
ISBN: 9781607647942 160764794X
OCLC Number: 703599339
Description: 1 online resource (xx, 672 pages) : illustrations
Contents: Introduction to model fitting: the fit model platform --
Standard least squares: introduction: the fit model platform --
Standard least squares: perspectives on the estimates: the fit model platform --
Standard least squares: exploring the prediction equation: the fit model platform --
Standard least squares: random effects: the fit model platform --
Stepwise regression: the fit model platform --
Multiple response fitting: the fit model platform --
Fitting dispersion effects with the LogLinear variance model: the fit model platform --
Logistic regression for nominal and ordinal response: the fit model platform --
Generalized linear models: the fit model platform --
Analyzing screening designs: the screen platform --
Nonlinear regression: the nonlinear platform --
Creating neural networks: using the neural platform --
Gaussian processes: models for analyzing computer experiments --
Recursive partitioning: the partition platform --
Time series analysis: the time series platform --
Categorical response analysis: the categorical platform --
Choice modeling: choice platform --
Correlations and multivariate techniques: the multivariate platform --
Clustering: the cluster platform --
Principal components: reducing dimensionality --
Discriminant analysis: the discriminant platform --
Partial least squares: the PLS platform --
Item response theory: the item analysis platform --
Plotting surfaces: the surface plot platform --
Profiling: response surface visualization, optimization, and simulation --
Statistical details: models in JMP.
Other Titles: JMP 9

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