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Kelvin probe force microscopy : measuring and compensating electrostatic forces

Author: Sascha Sadewasser; Thilo Glatzel
Publisher: Heidelberg ; New York : Springer-Verlag Berlin Heidelberg, ©2012.
Series: Springer series in surface sciences, 48.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
In the nearly 20 years of Kelvin probe force microscopy an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface  Read more...
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Genre/Form: Electronic books
Additional Physical Format: Print version:
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Sascha Sadewasser; Thilo Glatzel
ISBN: 9783642225666 3642225667
OCLC Number: 759858089
Description: 1 online resource (xiv, 331 pages) : illustrations (some color).
Contents: Introduction --
I. Technical Aspects --
Experimental technique and working modes --
Phase Modulation Kelvin Probe Microscopy --
Data interpretation, spatial resolution and deconvolution --
Contribution of the numerical approach to Kelvin probe force microscopies --
Quantum mechanical simulations of electrostatic tip-sample interactions --
II. Selected Applications --
Surface properties of III-V semiconductors --
Electronic surface properties of semiconductors devices --
Optoelectronic studies of solar cells --
Electrical characterization of low dimensional systems (quantum/nano-structures) --
Electronic structure of molecular assemblies --
KPFM for biochemical analysis --
Local work function analysis of photo catalysts --
Kelvin probe force microscopy with atomic resolution --
Summary.
Series Title: Springer series in surface sciences, 48.
Responsibility: Sascha Sadewasser, Thilo Glatzel, editors.

Abstract:

This volume presents a concise introduction to Kelvin probe force microscopy. The text discusses potential studies on semiconductor materials, nanostructures and devices are described, as well as  Read more...

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