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LATS2015 : 16th Latin-American Test Symposium, March 25-27, 2015, Puerto Vallarta, Mexico.

Author: Institute of Electrical and Electronics Engineers,; IEEE Computer Society. Technical Council on Test Technology,; IEEE Council on Electronic Design Automation,
Publisher: [Piscataway, New Jersey] : IEEE, [2015?] ©2015
Edition/Format:   eBook : Document : Conference publication : English
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Institute of Electrical and Electronics Engineers,; IEEE Computer Society. Technical Council on Test Technology,; IEEE Council on Electronic Design Automation,
OCLC Number: 917877253
Notes: " ... welcome all the participants to the 16th IEEE Latin-American Test Symposium (LATS2015). This year the conference was held in Puerto Vallarta, Mexico)."--PDF welcome page.
Description: 1 online resource : illustrations
Other Titles: 16th IEEE Latin-American Test Symposium
LATS 2015
Test Symposium (LATS), 2015 16th Latin-American
2015 16th Latin-American Test Symposium (LATS)
16th Latin-American Test Symposium (LATS)

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