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Life-cycle assessment of semiconductors

Author: Sarah B Boyd
Publisher: New York, NY : Springer, ©2012.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
Life-Cycle Assessment of Semiconductors presents the first and thus far only available transparent and complete life cycle assessment of semiconductor devices. A lack of reliable semiconductor LCA data has been a major challenge to evaluation of the potential environmental benefits of information technologies (IT). The analysis and results presented in this book will allow a higher degree of confidence and certainty  Read more...
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Genre/Form: Electronic books
Additional Physical Format: Printed edition:
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Sarah B Boyd
ISBN: 9781441999887 1441999884 1441999876 9781441999870
OCLC Number: 758362611
Description: 1 online resource (xxvii, 226 pages) : illustrations
Contents: 1 Introduction --
2 Semiconductor LCI Methods --
3 Semiconductor Manufacturing Trends in Product Type and Geography --
4 Life-cycle Energy and Global Warming Emissions of CMOS Logic --
5 Life-cycle Assessment of CMOS Logic --
6 Life-cycle Assessment of Flash Memory --
7 Life-cycle Assessment of Dynamic Random Access Memory --
8 Semiconductor LCA: The Road Ahead.
Responsibility: Sarah B. Boyd ; foreword by Arpad Horvath.

Abstract:

This volume presents a transparent and complete life cycle assessment of semiconductor devices. Readers will find an analysis that allows a higher degree of confidence in the use of IT in efforts to  Read more...

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