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Lightmetry, 2002 : metrology and testing techniques using light : 14-16 May, 2002, Warsaw, Poland

Author: Maksymilian PlutaMariusz SzyjerEwa PowichrowskaSociety of Photo-optical Instrumentation Engineers.Society of Photo-optical Instrumentation Engineers. Poland Chapter.All authors
Publisher: Bellingham, Wash. : SPIE, ©2003.
Series: SPIE Poland Chapter proceedings, 68.; Proceedings of SPIE--the International Society for Optical Engineering, v. 5064.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: (OCoLC)52054598
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Maksymilian Pluta; Mariusz Szyjer; Ewa Powichrowska; Society of Photo-optical Instrumentation Engineers.; Society of Photo-optical Instrumentation Engineers. Poland Chapter.; Institute of Applied Optics (Poland); Komitet Badań Naukowych (Poland); SPIE Digital Library.
ISBN: 0819448702 9780819448705
OCLC Number: 53838048
Notes: Previous conference entitled: Lightmetry : metrology, spectroscopy, and testing techniques using light.
Reproduction Notes: Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2003. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.
Description: xx, 338 pages : illustrations ; 28 cm.
Series Title: SPIE Poland Chapter proceedings, 68.; Proceedings of SPIE--the International Society for Optical Engineering, v. 5064.
Other Titles: Lightmetry : metrology, spectroscopy, and testing techniques using light
Metrology and testing techniques using light
Responsibility: Maksymilian Pluta, Mariusz Szyjer, editors ; Ewa Powichrowska, co-editor ; organized by SPIE Poland Chapter [and] Institute of Applied Optics (Poland) ; sponsored by SPIE--the International Society for Optical Engineering [and] State Committee for Scientific Research (Poland) ; published by Spie--the International Society for Optical Engineering.

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