skip to content
Lightmetry : metrology, spectroscopy, and testing techniques using light : 5-8 June 2000, Pultusk, Poland Preview this item
ClosePreview this item
Checking...

Lightmetry : metrology, spectroscopy, and testing techniques using light : 5-8 June 2000, Pultusk, Poland

Author: Maksymilian PlutaMariusz SzyjerEwa PowichrowskaSociety of Photo-optical Instrumentation Engineers. Poland Chapter.Institute of Applied Optics (Poland)All authors
Publisher: Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, ©2001.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 4517.; SPIE Poland Chapter proceedings, 58.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Database:WorldCat
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

 

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Maksymilian Pluta; Mariusz Szyjer; Ewa Powichrowska; Society of Photo-optical Instrumentation Engineers. Poland Chapter.; Institute of Applied Optics (Poland); Society of Photo-optical Instrumentation Engineers.; Komitet Badań Naukowych (Poland)
ISBN: 0819442402 9780819442406
OCLC Number: 48157326
Description: xxiii, 302 pages : illustrations ; 28 cm.
Contents: Radiometry, lasermetry, and properties and corrections of photometric detectors --
Absorption and transmission spectroscopy --
Reflectometry and scatterometry --
Ellipsometry, polarimetry, spectropolarimetry, and related areas of research --
Colorimetry and filtering of color images --
Interferometry and interference filters.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 4517.; SPIE Poland Chapter proceedings, 58.
Other Titles: Metrology, spectroscopy, and testing techniques using light
Responsibility: Maksymilian Pluta, editor ; Mariusz Szyjer, Ewa Powichrowska, coeditors ; organized by SPIE Poland Chapter [and] Institute of Applied Optics (Poland) ; sponsored by SPIE--the International Society for Optical Engineering [and] State Committee for Scientific Research (Poland).

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/48157326> # Lightmetry : metrology, spectroscopy, and testing techniques using light : 5-8 June 2000, Pultusk, Poland
    a schema:Book, schema:CreativeWork ;
   library:oclcnum "48157326" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/478187326#Place/bellingham_wash> ; # Bellingham, Wash.
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/wau> ;
   schema:about <http://id.worldcat.org/fast/1715944> ; # Measurement
   schema:about <http://id.worldcat.org/fast/1046776> ; # Optical measurements
   schema:about <http://id.loc.gov/authorities/subjects/sh85076871> ; # Light
   schema:about <http://id.worldcat.org/fast/1046682> ; # Optical detectors
   schema:about <http://id.worldcat.org/fast/998476> ; # Light
   schema:about <http://experiment.worldcat.org/entity/work/data/478187326#Topic/measurement> ; # Measurement
   schema:about <http://dewey.info/class/681.25/e21/> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/478187326#Topic/optical_detectors> ; # Optical detectors
   schema:about <http://id.worldcat.org/fast/1068305> ; # Polarization (Light)
   schema:about <http://experiment.worldcat.org/entity/work/data/478187326#Topic/optical_measurements> ; # Optical measurements
   schema:alternateName "Metrology, spectroscopy, and testing techniques using light" ;
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://viaf.org/viaf/129711063> ; # Komitet Badań Naukowych (Poland)
   schema:contributor <http://viaf.org/viaf/56270792> ; # Ewa Powichrowska
   schema:contributor <http://viaf.org/viaf/156972271> ; # Society of Photo-optical Instrumentation Engineers. Poland Chapter.
   schema:contributor <http://viaf.org/viaf/278875709> ; # Mariusz Szyjer
   schema:contributor <http://viaf.org/viaf/124178567> ; # Institute of Applied Optics (Poland)
   schema:contributor <http://viaf.org/viaf/127619765> ; # Society of Photo-optical Instrumentation Engineers.
   schema:contributor <http://viaf.org/viaf/9916638> ; # Maksymilian Pluta
   schema:copyrightYear "2001" ;
   schema:datePublished "2001" ;
   schema:description "Radiometry, lasermetry, and properties and corrections of photometric detectors -- Absorption and transmission spectroscopy -- Reflectometry and scatterometry -- Ellipsometry, polarimetry, spectropolarimetry, and related areas of research -- Colorimetry and filtering of color images -- Interferometry and interference filters."@en ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/478187326> ;
   schema:genre "Conference publication"@en ;
   schema:genre "Conference papers and proceedings"@en ;
   schema:inLanguage "en" ;
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/478187326#Series/proceedings_of_spie_the_international_society_for_optical_engineering> ; # Proceedings of SPIE--the International Society for Optical Engineering ;
   schema:isPartOf <http://worldcat.org/issn/0277-786X> ; # SPIE proceedings series,
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/478187326#Series/spie_poland_chapter_proceedings> ; # SPIE Poland Chapter proceedings ;
   schema:name "Lightmetry : metrology, spectroscopy, and testing techniques using light : 5-8 June 2000, Pultusk, Poland"@en ;
   schema:productID "48157326" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/48157326#PublicationEvent/bellingham_wash_society_of_photo_optical_instrumentation_engineers_2001> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/478187326#Agent/society_of_photo_optical_instrumentation_engineers> ; # Society of Photo-optical Instrumentation Engineers
   schema:workExample <http://worldcat.org/isbn/9780819442406> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/48157326> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/478187326#Agent/society_of_photo_optical_instrumentation_engineers> # Society of Photo-optical Instrumentation Engineers
    a bgn:Agent ;
   schema:name "Society of Photo-optical Instrumentation Engineers" ;
    .

<http://experiment.worldcat.org/entity/work/data/478187326#Place/bellingham_wash> # Bellingham, Wash.
    a schema:Place ;
   schema:name "Bellingham, Wash." ;
    .

<http://experiment.worldcat.org/entity/work/data/478187326#Series/proceedings_of_spie_the_international_society_for_optical_engineering> # Proceedings of SPIE--the International Society for Optical Engineering ;
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/48157326> ; # Lightmetry : metrology, spectroscopy, and testing techniques using light : 5-8 June 2000, Pultusk, Poland
   schema:name "Proceedings of SPIE--the International Society for Optical Engineering ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/478187326#Series/spie_poland_chapter_proceedings> # SPIE Poland Chapter proceedings ;
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/48157326> ; # Lightmetry : metrology, spectroscopy, and testing techniques using light : 5-8 June 2000, Pultusk, Poland
   schema:name "SPIE Poland Chapter proceedings ;" ;
    .

<http://id.worldcat.org/fast/1046682> # Optical detectors
    a schema:Intangible ;
   schema:name "Optical detectors"@en ;
    .

<http://id.worldcat.org/fast/1046776> # Optical measurements
    a schema:Intangible ;
   schema:name "Optical measurements"@en ;
    .

<http://id.worldcat.org/fast/1068305> # Polarization (Light)
    a schema:Intangible ;
   schema:name "Polarization (Light)"@en ;
    .

<http://id.worldcat.org/fast/1715944> # Measurement
    a schema:Intangible ;
   schema:name "Measurement"@en ;
    .

<http://id.worldcat.org/fast/998476> # Light
    a schema:Intangible ;
   schema:name "Light"@en ;
    .

<http://viaf.org/viaf/124178567> # Institute of Applied Optics (Poland)
    a schema:Organization ;
   schema:name "Institute of Applied Optics (Poland)" ;
    .

<http://viaf.org/viaf/127619765> # Society of Photo-optical Instrumentation Engineers.
    a schema:Organization ;
   schema:name "Society of Photo-optical Instrumentation Engineers." ;
    .

<http://viaf.org/viaf/129711063> # Komitet Badań Naukowych (Poland)
    a schema:Organization ;
   schema:name "Komitet Badań Naukowych (Poland)" ;
    .

<http://viaf.org/viaf/156972271> # Society of Photo-optical Instrumentation Engineers. Poland Chapter.
    a schema:Organization ;
   schema:name "Society of Photo-optical Instrumentation Engineers. Poland Chapter." ;
    .

<http://viaf.org/viaf/278875709> # Mariusz Szyjer
    a schema:Person ;
   schema:familyName "Szyjer" ;
   schema:givenName "Mariusz" ;
   schema:name "Mariusz Szyjer" ;
    .

<http://viaf.org/viaf/56270792> # Ewa Powichrowska
    a schema:Person ;
   schema:familyName "Powichrowska" ;
   schema:givenName "Ewa" ;
   schema:name "Ewa Powichrowska" ;
    .

<http://viaf.org/viaf/9916638> # Maksymilian Pluta
    a schema:Person ;
   schema:familyName "Pluta" ;
   schema:givenName "Maksymilian" ;
   schema:name "Maksymilian Pluta" ;
    .

<http://worldcat.org/isbn/9780819442406>
    a schema:ProductModel ;
   schema:isbn "0819442402" ;
   schema:isbn "9780819442406" ;
    .

<http://worldcat.org/issn/0277-786X> # SPIE proceedings series,
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/48157326> ; # Lightmetry : metrology, spectroscopy, and testing techniques using light : 5-8 June 2000, Pultusk, Poland
   schema:issn "0277-786X" ;
   schema:name "SPIE proceedings series," ;
    .

<http://www.worldcat.org/title/-/oclc/48157326>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
   schema:about <http://www.worldcat.org/oclc/48157326> ; # Lightmetry : metrology, spectroscopy, and testing techniques using light : 5-8 June 2000, Pultusk, Poland
   schema:dateModified "2016-05-11" ;
   void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.