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Machine learning : an algorithmic perspective

Author: Stephen Marsland
Publisher: Boca Raton : CRC Press, [2015]
Series: Chapman & Hall/CRC machine learning & pattern recognition series.
Edition/Format:   Print book : English : Second editionView all editions and formats
Summary:
"Remedying this deficiency, Machine Learning: An Algorithmic Perspective, Second Edition helps students understand the algorithms of machine learning. It puts them on a path toward mastering the relevant mathematics and statistics as well as the necessary programming and experimentation."--The back cover.
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Additional Physical Format: Online version:
Marsland, Stephen.
Machine Learning.
Boca Raton, FL : CRC Press, [2015]
(OCoLC)900220504
Document Type: Book
All Authors / Contributors: Stephen Marsland
ISBN: 9781466583283 1466583282 1466583363 9781466583368
OCLC Number: 895686170
Notes: "A Chapman & Hall book."
Description: xx, 437 pages : illustrations ; 25 cm.
Contents: Introduction --
Preliminaries --
Neurons, neural networks, and linear discriminants --
The multi-layer perceptron --
Radial basis functions and splines --
Dimensionality reduction --
Probabilistic learning --
Support vector machines --
Optimisation and search --
Evolutionary learning --
Reinforcement learning --
Learning with trees --
Decision by committee: ensemble learning --
Unsupervised learning --
Markov chain Monte Carlo (MCMC) methods --
Graphical models --
Symmetric weights and deep belief networks --
Gaussian processes --
Python.
Series Title: Chapman & Hall/CRC machine learning & pattern recognition series.
Responsibility: Stephen Marsland.

Abstract:

Covers neural networks, graphical models, reinforcement learning, evolutionary algorithms, dimensionality reduction methods, and the important area of optimization. This book includes examples based  Read more...

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"I thought the first edition was hands down, one of the best texts covering applied machine learning from a Python perspective. I still consider this to be the case. The text, already extremely broad Read more...

 
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