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Machine vision applications in industrial inspection XII : 21-22 January, 2004, San Jose, California, USA

Author: Jeffery R Price; Fabrice Mériaudeau; IS & T--the Society for Imaging Science and Technology.; Society of Photo-optical Instrumentation Engineers.
Publisher: Bellingham, Wash., USA : SPIE, ©2004.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 5303.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Jeffery R Price; Fabrice Mériaudeau; IS & T--the Society for Imaging Science and Technology.; Society of Photo-optical Instrumentation Engineers.
ISBN: 0819452068 9780819452061
OCLC Number: 55151746
Description: vi, 204 pages : illustrations ; 28 cm.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 5303.
Other Titles: Proceedings of electronic imaging science and technology
Electronic imaging science and technology
Responsibility: Jeffery R. Price, Fabrice Mériaudeau, chairs/editors ; sponsored ... by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering.

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