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Manual of patent examining procedure (MPEP).

Author: United States. Patent and Trademark Office.
Publisher: [Washington, D.C.] : U.S. Patent and Trademark Office, [2001]-
Edition/Format:   eBook : Document : National government publication : English : Ed. 8 (E8)View all editions and formats
Database:WorldCat
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Genre/Form: Rules and practice Handbooks, manuals, etc
Handbooks, manuals, etc
Additional Physical Format: Manual of patent examining procedure.
1 v. (loose-leaf)
(OCoLC)48617077
Manual of patent examining procedure.
1 v. in 2 (loose-leaf)
(OCoLC)48616246
Material Type: Document, Government publication, National government publication, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: United States. Patent and Trademark Office.
OCLC Number: 49402334
Notes: Title from title screen.
Paper version for sale by the Supt. of Docs., U.S.G.P.O.
"August, 2001."
Includes index.
Details: System requirements: Adobe Acrobat Reader to access PDF files.; Mode of access: Internet from the PTO web site. Address as of 3/26/02: http://www.uspto.gov/web/offices/pac/mpep/mpep.htm; current access is available via PURL.

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Linked Data


Primary Entity

<http://www.worldcat.org/oclc/49402334> # Manual of patent examining procedure (MPEP).
    a schema:Book, schema:MediaObject, schema:CreativeWork ;
    library:oclcnum "49402334" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/dcu> ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/1910201340#Place/washington_d_c> ; # Washington, D.C.
    schema:about <http://id.worldcat.org/fast/1054855> ; # Patent practice
    schema:about <http://id.worldcat.org/fast/1204155> ; # United States
    schema:about <http://id.loc.gov/authorities/subjects/sh2008108954> ; # Patent laws and legislation--United States
    schema:about <http://viaf.org/viaf/149517371> ; # United States. Patent and Trademark Office.
    schema:about <http://id.worldcat.org/fast/1054823> ; # Patent laws and legislation
    schema:about <http://id.loc.gov/authorities/classification/KF3120> ;
    schema:about <http://id.loc.gov/authorities/subjects/sh2008108956> ; # Patent practice--United States
    schema:about <http://experiment.worldcat.org/entity/work/data/1910201340#Organization/united_states_patent_and_trademark_office> ; # United States. Patent and Trademark Office
    schema:bookEdition "Ed. 8 (E8)." ;
    schema:bookFormat schema:EBook ;
    schema:contributor <http://viaf.org/viaf/149517371> ; # United States. Patent and Trademark Office.
    schema:datePublished "2001/9999" ;
    schema:datePublished "2001/" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/1910201340> ;
    schema:genre "National government publication"@en ;
    schema:genre "Handbooks and manuals"@en ;
    schema:genre "Government publication"@en ;
    schema:inLanguage "en" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/48616246> ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/48617077> ;
    schema:name "Manual of patent examining procedure (MPEP)."@en ;
    schema:productID "49402334" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/49402334#PublicationEvent/washington_d_c_u_s_patent_and_trademark_office_2001> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/1910201340#Agent/u_s_patent_and_trademark_office> ; # U.S. Patent and Trademark Office
    schema:url <http://purl.access.gpo.gov/GPO/LPS17429> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/49402334> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/1910201340#Agent/u_s_patent_and_trademark_office> # U.S. Patent and Trademark Office
    a bgn:Agent ;
    schema:name "U.S. Patent and Trademark Office" ;
    .

<http://experiment.worldcat.org/entity/work/data/1910201340#Organization/united_states_patent_and_trademark_office> # United States. Patent and Trademark Office
    a schema:Organization ;
    schema:name "United States. Patent and Trademark Office" ;
    .

<http://experiment.worldcat.org/entity/work/data/1910201340#Place/washington_d_c> # Washington, D.C.
    a schema:Place ;
    schema:name "Washington, D.C." ;
    .

<http://id.loc.gov/authorities/subjects/sh2008108954> # Patent laws and legislation--United States
    a schema:Intangible ;
    schema:name "Patent laws and legislation--United States"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh2008108956> # Patent practice--United States
    a schema:Intangible ;
    schema:name "Patent practice--United States"@en ;
    .

<http://id.worldcat.org/fast/1054823> # Patent laws and legislation
    a schema:Intangible ;
    schema:name "Patent laws and legislation"@en ;
    .

<http://id.worldcat.org/fast/1054855> # Patent practice
    a schema:Intangible ;
    schema:name "Patent practice"@en ;
    .

<http://id.worldcat.org/fast/1204155> # United States
    a schema:Place ;
    schema:name "United States" ;
    .

<http://viaf.org/viaf/149517371> # United States. Patent and Trademark Office.
    a schema:Organization ;
    schema:name "United States. Patent and Trademark Office." ;
    schema:name "United States. Patent and Trademark Office" ;
    .

<http://www.worldcat.org/oclc/48616246>
    a schema:CreativeWork ;
    rdfs:label "Manual of patent examining procedure." ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/49402334> ; # Manual of patent examining procedure (MPEP).
    .

<http://www.worldcat.org/oclc/48617077>
    a schema:CreativeWork ;
    rdfs:label "Manual of patent examining procedure." ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/49402334> ; # Manual of patent examining procedure (MPEP).
    .


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