skip to content
The matching between absorption and the frequency dependence of refraction Preview this item
ClosePreview this item
Checking...

The matching between absorption and the frequency dependence of refraction

Author: J H Van Vleck; Massachusetts Institute of Technology. Radiation Laboratory.
Publisher: Cambridge, Mass. : Radiation Laboratory, Massachusetts Institute of Technology, 1945.
Series: Report (Massachusetts Institute of Technology. Radiation Laboratory), 735.
Edition/Format:   Print book : English
Database:WorldCat
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

 

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Document Type: Book
All Authors / Contributors: J H Van Vleck; Massachusetts Institute of Technology. Radiation Laboratory.
OCLC Number: 13693318
Notes: "NDRC. Div. 14. OEMsr-262."
Massachusetts Institute of Technology Barker Library also has microfiche.
Description: 13 pages, [5] pages of plates : illustrations ; 29 cm.
Series Title: Report (Massachusetts Institute of Technology. Radiation Laboratory), 735.
Responsibility: J.H. Van Vleck.

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.

Similar Items

Related Subjects:(1)

Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/13693318> # The matching between absorption and the frequency dependence of refraction
    a schema:CreativeWork, schema:Book ;
   library:oclcnum "13693318" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/7789892#Place/cambridge_mass> ; # Cambridge, Mass.
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/mau> ;
   schema:about <http://id.worldcat.org/fast/1087609> ; # Radio wave propagation
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://viaf.org/viaf/145496132> ; # Massachusetts Institute of Technology. Radiation Laboratory.
   schema:creator <http://viaf.org/viaf/5323249> ; # John Hasbrouck Van Vleck
   schema:datePublished "1945" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/7789892> ;
   schema:inLanguage "en" ;
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/7789892#Series/report> ; # Report ;
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/7789892#Series/report_massachusetts_institute_of_technology_radiation_laboratory> ; # Report (Massachusetts Institute of Technology. Radiation Laboratory) ;
   schema:name "The matching between absorption and the frequency dependence of refraction"@en ;
   schema:productID "13693318" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/13693318#PublicationEvent/cambridge_mass_radiation_laboratory_massachusetts_institute_of_technology_1945> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/7789892#Agent/radiation_laboratory_massachusetts_institute_of_technology> ; # Radiation Laboratory, Massachusetts Institute of Technology
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/13693318> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/7789892#Agent/radiation_laboratory_massachusetts_institute_of_technology> # Radiation Laboratory, Massachusetts Institute of Technology
    a bgn:Agent ;
   schema:name "Radiation Laboratory, Massachusetts Institute of Technology" ;
    .

<http://experiment.worldcat.org/entity/work/data/7789892#Place/cambridge_mass> # Cambridge, Mass.
    a schema:Place ;
   schema:name "Cambridge, Mass." ;
    .

<http://experiment.worldcat.org/entity/work/data/7789892#Series/report> # Report ;
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/13693318> ; # The matching between absorption and the frequency dependence of refraction
   schema:name "Report ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/7789892#Series/report_massachusetts_institute_of_technology_radiation_laboratory> # Report (Massachusetts Institute of Technology. Radiation Laboratory) ;
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/13693318> ; # The matching between absorption and the frequency dependence of refraction
   schema:name "Report (Massachusetts Institute of Technology. Radiation Laboratory) ;" ;
    .

<http://id.worldcat.org/fast/1087609> # Radio wave propagation
    a schema:Intangible ;
   schema:name "Radio wave propagation"@en ;
    .

<http://viaf.org/viaf/145496132> # Massachusetts Institute of Technology. Radiation Laboratory.
    a schema:Organization ;
   schema:name "Massachusetts Institute of Technology. Radiation Laboratory." ;
    .

<http://viaf.org/viaf/5323249> # John Hasbrouck Van Vleck
    a schema:Person ;
   schema:birthDate "1899" ;
   schema:deathDate "1980" ;
   schema:familyName "Van Vleck" ;
   schema:givenName "John Hasbrouck" ;
   schema:givenName "J. H." ;
   schema:name "John Hasbrouck Van Vleck" ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.