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Materials characterization : introduction to microscopic and spectroscopic methods

Author: Y Leng
Publisher: Singapore ; Hoboken, NJ : J. Wiley, ©2008.
Edition/Format:   Print book : EnglishView all editions and formats
Database:WorldCat
Summary:
"This work is an illustrated introduction to modern characterization techniques, enabling users to understand the composition and structure of materials. Encompassing not just material structure but also chemical analysis, Materials Characterization covers all key structural and functional materials from metals and semiconductors to polymers and ceramics." "Materials Characterization is an introductory book ideal  Read more...
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Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Y Leng
ISBN: 9780470822982 0470822988
OCLC Number: 190843586
Description: xii, 337 pages : illustrations ; 26 cm
Contents: Light microscopy --
X-ray diffraction methods --
Transmission electron microscopy --
Scanning electron microscopy --
Scanning probe microscopy --
X-ray spectroscopy for elemental analysis --
Electron spectroscopy for surface analysis --
Secondary ion mass spectrometry for surface analysis --
Vibrational spectroscopy for molecular analysis --
Thermal analysis.
Responsibility: Yang Leng.
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Abstract:

This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included.  Read more...

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