Home

WorldCat Home About WorldCat Help Get E-mail Updates Feedback

Search

Search for Library Items Search for Lists Search for Contacts Search for a Library

Create lists, bibliographies and reviews: or

Cite/Export

Cite/Export

Copy a citation

APA (6th ed.)

Chicago (Author-Date, 15th ed.)

Harvard (18th ed.)

MLA (7th ed.)

Turabian (6th ed.)

Export a citation
Export to RefWorks Export to EndNote / Reference Manager Export to EasyBib Cancel
Note: Citations are based on reference standards. However, formatting rules can vary widely between applications and fields of interest or study. The specific requirements or preferences of your reviewing publisher, classroom teacher, institution or organization should be applied.
Print
E-mail

E-mail

All fields are required.

The E-mail Address(es) field is required. Please enter recipient e-mail address(es).

The E-mail Address(es) you entered is(are) not in a valid format. Please re-enter recipient e-mail address(es).

You may send this item to up to five recipients.
Enter recipient e-mail address(es): Separate up to five addresses with commas (,)
The name field is required. Please enter your name.
Enter your name: Subject:
The E-mail message field is required. Please enter the message.
E-mail Message: I thought you might be interested in this item at http://www.worldcat.org/oclc/178207627 Title: Measurement and instrumentation : trends and applications Author: M K Ghosh; S Sen; S Mukhopadhyay Publisher: Boca Raton : New Delhi : CRC/Taylor & Francis ; Ane Books India, 2008. ISBN/ISSN: 9781420074321 1420074326 9788180522567 8180522563 OCLC:178207627

The ReCaptcha terms you entered were incorrect. Please try to match the 2 words shown in the window, or try the audio version.

Cancel
Share
Permalink

Permalink

Copy this URL to link to this page:

Write a review
Rate this item:
- 1
- 2
- 3
- 4
- 5

Measurement and instrumentation : trends and applications

Preview this item

Measurement and instrumentation : trends and applications

Author:	M K Ghosh; S Sen; S Mukhopadhyay
Publisher:	Boca Raton : CRC/Taylor & Francis ; New Delhi : Ane Books India, 2008.
Edition/Format:	Book : EnglishView all editions and formats
Summary:	"This book is designed for sensor undergraduates as well as postgraduates specializing in Measurement and Instrumentation as a major. It is also targeted towards practising engineers and researchers seeking exposure of certain advanced techniques of measurement. Apart from few chapters on fundamental topics, included for continuity, the book presents a collection of specialized sensing and signal processing Read more...
Rating:	(not yet rated) 0 with reviews - Be the first.

Borrow / obtain a copy

Find a copy in the library

Finding libraries that hold this item...

Details

Document Type:	Book
All Authors / Contributors:	M K Ghosh; S Sen; S Mukhopadhyay Find more information about:
ISBN:	9781420074321 1420074326 9788180522567 8180522563
OCLC Number:	178207627
Description:	xxii, 666 p. : ill. ; 24 cm.
Contents:	Pt. A. Introduction -- 1. Evolution and trends in measurement and instrumentation / M. K. Ghosh -- 2. Instrument performance evaluation / S. Sen -- Pt. B. Sensors -- 3. Electrical sensors / S. Sen -- 4. Optical sensors / M. K. Ghosh -- 5. Chemical sensors / S. Basu and S. Roy -- 6. Biochemical sensors / B. Adhikari -- 7. Nucleonic sensors / M. K. Ghosh -- 8. Microwave sensors / A. K. Mallick -- 9. Silicon micromachining, microsensors and MEMS / S. Kal -- 10. Design of MEMS capactitative accelerometers / K. Biswas, S. Sen and P. K. Dutta -- Pt. C. Signal conditioning and processing -- 11. Signal conditioning and processing / S. Sinha -- 12. Telemetry and data communication / S. Sinha -- 13. High order filter design / A. Barua -- Pt. D. Image based instrumentation -- 14. Boundary extraction and contour propagation of heart image sequences / A. Mishra and P. K. Dutta -- 15. Remote sensing - an overview / S. Sengupta -- Pt. E. Intelligent and virtual instrumentation -- 16. Sensor fusion & estimation in instrumentation / S. Bhattacharya, R. Perla and S. Mukhopadhyay -- 17. On-line monitoring of manufacturing processes : a case study of tool condition monitoring in face milling / S. Mukhopadhyay, A. Patra, A. B. Chattopadhyay, P. Bhattacharyya and D. Sengupta -- 18. Real time power system frequency estimation techniques / A. Routrary and A. K. Pradhan -- Pt. F. Applications -- 19. Automation in irrigation / A. Joshi and K. N. Tiwari -- 20. VLSI in medical instrumentation / B. Das and S. Banerjee -- 21. Robotic instrumentation / M. K. Ghosh -- 22. Bioprocess instrumentation / S. Sinha and P. S. Pal -- 23. Measurement of two phase flow parameters (void fraction and flow rate) / P. K. Das.
Other Titles:	Measurement & instrumentation
Responsibility:	editors, M.K. Ghosh, S. Sen, S. Mukhopadhyay.
More information:	Publisher Website

Abstract:

Offers a collection of specialized sensing and signal processing techniques. This volume covers such as electrical, optical, chemical, biochemical, nucleonic, microwave, and MEMS sensors; signal Read more...

Reviews

User-contributed reviews

Linked Data

More info about Linked Data

<http://www.worldcat.org/oclc/178207627>

library:oclcnum

"178207627"

library:placeOfPublication

<http://id.loc.gov/vocabulary/countries/flu>

rdf:type

schema:Country

library:placeOfPublication

rdf:type	schema:Place
schema:name	"Boca Raton"

library:placeOfPublication

rdf:type	schema:Place
schema:name	"New Delhi"

owl:sameAs

<info:oclcnum/178207627>

rdf:type

schema:Book

rdfs:seeAlso

<http://www.worldcat.org/isbn/9788180522567>

owl:sameAs	<urn:isbn:9788180522567>
rdf:type	library:Volume
rdf:type	schema:ProductModel
rdf:type	schema:CreativeWork
schema:bookFormat	schema:Paperback
schema:description	"pbk."
schema:isbn	"9788180522567"
schema:model	<http://www.worldcat.org/oclc/178207627>

rdfs:seeAlso

<http://www.worldcat.org/isbn/8180522563>

owl:sameAs	<urn:isbn:8180522563>
rdf:type	library:Volume
rdf:type	schema:ProductModel
rdf:type	schema:CreativeWork
schema:bookFormat	schema:Paperback
schema:description	"pbk."
schema:isbn	"8180522563"
schema:model	<http://www.worldcat.org/oclc/178207627>

rdfs:seeAlso

<http://www.worldcat.org/isbn/1420074326>

owl:sameAs	<urn:isbn:1420074326>
rdf:type	schema:ProductModel
rdf:type	schema:CreativeWork
schema:isbn	"1420074326"
schema:model	<http://www.worldcat.org/oclc/178207627>

rdfs:seeAlso

<http://www.worldcat.org/isbn/9781420074321>

owl:sameAs	<urn:isbn:9781420074321>
rdf:type	schema:ProductModel
rdf:type	schema:CreativeWork
schema:isbn	"9781420074321"
schema:model	<http://www.worldcat.org/oclc/178207627>

schema:about

<http://id.worldcat.org/fast/1108810>

rdf:type	schema:Intangible
schema:name	"Scientific apparatus and instruments"

schema:about

<http://id.worldcat.org/fast/1715944>

rdf:type	schema:Intangible
schema:name	"Measurement"

schema:about

<http://dewey.info/class/620.0044/e22/>

rdf:type

schema:Intangible

schema:about

madsrdf:isIdentifiedByAuthority	<http://id.loc.gov/authorities/subjects/sh85043176>
rdf:type	schema:Intangible
schema:name	"Engineering--Measurement."

schema:about

madsrdf:isIdentifiedByAuthority	<http://id.loc.gov/authorities/subjects/sh85118677>
rdf:type	schema:Intangible
schema:name	"Scientific apparatus and instruments."

schema:about

<http://id.worldcat.org/fast/910375>

rdf:type	schema:Intangible
schema:name	"Engineering--Measurement"

schema:about

madsrdf:isIdentifiedByAuthority	<http://id.loc.gov/authorities/subjects/sh85037291>
rdf:type	schema:Intangible
schema:name	"Detectors."

schema:about

madsrdf:isIdentifiedByAuthority	<http://id.loc.gov/authorities/subjects/sh85043229>
rdf:type	schema:Intangible
schema:name	"Engineering instruments."

schema:about

<http://id.worldcat.org/fast/910572>

rdf:type	schema:Intangible
schema:name	"Engineering instruments"

schema:about

<http://id.worldcat.org/fast/891594>

rdf:type	schema:Intangible
schema:name	"Detectors"

schema:about

madsrdf:isIdentifiedByAuthority	<http://id.loc.gov/authorities/subjects/sh85083608>
rdf:type	schema:Intangible
schema:name	"Measurement."

schema:contributor

<http://viaf.org/viaf/79381761>

madsrdf:isIdentifiedByAuthority	<http://id.loc.gov/authorities/names/n81057539>
rdf:type	schema:Person
rdfs:label	"Sen, S."

schema:contributor

<http://viaf.org/viaf/48597557>

madsrdf:isIdentifiedByAuthority	<http://id.loc.gov/authorities/names/n2003004716>
rdf:type	schema:Person
rdfs:label	"Mukhopadhyay, S."

schema:contributor

<http://viaf.org/viaf/214345301>

madsrdf:isIdentifiedByAuthority	<http://id.loc.gov/authorities/names/n2011053637>
rdf:type	schema:Person
rdfs:label	"Ghosh, M. K."

schema:datePublished

"2008"

schema:inLanguage

"en"

schema:name

"Measurement and instrumentation : trends and applications"

schema:numberOfPages

"666"

schema:publisher

rdf:type	schema:Organization
schema:name	"CRC/Taylor & Francis"

schema:publisher

rdf:type	schema:Organization
schema:name	"Ane Books India"

schema:reviews

rdf:type	schema:Review
schema:itemReviewed	<http://www.worldcat.org/oclc/178207627>
schema:reviewBody	""This book is designed for sensor undergraduates as well as postgraduates specializing in Measurement and Instrumentation as a major. It is also targeted towards practising engineers and researchers seeking exposure of certain advanced techniques of measurement. Apart from few chapters on fundamental topics, included for continuity, the book presents a collection of specialized sensing and signal processing techniques not easily found between two covers."--BOOK JACKET."

Please sign in to WorldCat

Don't have an account? You can easily create a free account.

You:	Sign In \| Register \| My WorldCat \| My Lists \| My Watchlist \| My Reviews \| My Tags \| My Saved Searches
WorldCat:	Home \| About \| Help \| Get E-mail Updates \| Feedback \| Search

More like this

Subjects

User tags

User lists

Similar Items

Measurement and instrumentation : trends and applications

Find a copy in the library

Details

Abstract:

Reviews

Tags

All user tags (1)

Similar Items

Related Subjects:(5)

User lists with this item (3)

Linked Data