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Measurement methods for the semiconductor device industry : a summary of NBS activity

Author: W Murray Bullis; Institute for Applied Technology (U.S.); United States. National Bureau of Standards.; United States. Department of Commerce.
Publisher: Washington, DC : U.S. Department of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1969.
Series: U.S. National Bureau of Standards. Technical note, 511
Edition/Format:   Print book : National government publication : EnglishView all editions and formats
Database:WorldCat
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Additional Physical Format: Online version:
Bullis, W. Murray, 1930-
Measurement methods for the semiconductor device industry - a summary of NBS activity.
Washington; for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1969
(OCoLC)632853826
Material Type: Government publication, National government publication
Document Type: Book
All Authors / Contributors: W Murray Bullis; Institute for Applied Technology (U.S.); United States. National Bureau of Standards.; United States. Department of Commerce.
OCLC Number: 11182754
Notes: Issued December 1969.
Description: ii, 22 pages : illustrations, charts ; 27 cm.
Series Title: U.S. National Bureau of Standards. Technical note, 511
Responsibility: W. Murray Bullis.

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