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|Additional Physical Format:||Online version:
Bullis, W. Murray, 1930-
Measurement methods for the semiconductor device industry - a summary of NBS activity.
Washington; for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1969
|Material Type:||Government publication, National government publication|
|All Authors / Contributors:||
W Murray Bullis; Institute for Applied Technology (U.S.); United States. National Bureau of Standards.; United States. Department of Commerce.
|Notes:||Issued December 1969.|
|Description:||ii, 22 pages : illustrations, charts ; 27 cm.|
|Series Title:||U.S. National Bureau of Standards. Technical note, 511|
|Responsibility:||W. Murray Bullis.|