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Measurement of carrier lifetime in semiconductors; an annotated bibliography covering the period 1949-1967
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Measurement of carrier lifetime in semiconductors; an annotated bibliography covering the period 1949-1967

Author: W Murray Bullis
Publisher: Washington, U.S. National Bureau of Standards; for sale by the Supt of Docs., U.S. Govt. Print. Off., 1968.
Series: NBS technical note, 465.
Edition/Format:   Book : EnglishView all editions and formats
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Genre/Form: Bibliography
Additional Physical Format: Online version:
Bullis, W. Murray, 1930-
Measurement of carrier lifetime in semiconductors.
Washington, U.S. National Bureau of Standards; for sale by the Supt of Docs., U.S. Govt. Print. Off., 1968
(OCoLC)632508074
Document Type: Book
All Authors / Contributors: W Murray Bullis
OCLC Number: 57540
Description: ii, 62 p. 26 cm.
Series Title: NBS technical note, 465.
Responsibility: [by] W. Murray Bullis.

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