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| Genre/Form: | Bibliography |
|---|---|
| Additional Physical Format: | Online version: Bullis, W. Murray, 1930- Measurement of carrier lifetime in semiconductors. Washington, U.S. National Bureau of Standards; for sale by the Supt of Docs., U.S. Govt. Print. Off., 1968 (OCoLC)632508074 |
| Document Type: | Book |
| All Authors / Contributors: |
W Murray Bullis |
| OCLC Number: | 57540 |
| Description: | ii, 62 p. 26 cm. |
| Series Title: | NBS technical note, 465. |
| Responsibility: | [by] W. Murray Bullis. |
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