skip to content
The measurement of intelligence ; an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale. Preview this item
ClosePreview this item
Checking...

The measurement of intelligence ; an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale.

Author: Lewis M Terman
Publisher: London, England : G. Harrap, 1919.
Edition/Format:   Print book : EnglishView all editions and formats
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Document Type: Book
All Authors / Contributors: Lewis M Terman
OCLC Number: 10088180
Notes: "Selected references": p[349]-356; "Suggestion for a teacher's private library on exceptional children": p[357]-358.
Description: xviii, 362 pages : illustrations, diagrams
Other Titles: Binet-Simon intelligence scale.

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/10088180> # The measurement of intelligence ; an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale.
    a schema:CreativeWork, schema:Book ;
    library:oclcnum "10088180" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/enk> ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/116911421#Place/london_england> ; # London, England
    rdfs:seeAlso <http://experiment.worldcat.org/entity/work/data/116911421#CreativeWork/binet_simon_intelligence_scale> ; # Binet-Simon intelligence scale.
    schema:about <http://experiment.worldcat.org/entity/work/data/116911421#Topic/educational_tests_and_measurements> ; # Educational tests and measurements
    schema:about <http://experiment.worldcat.org/entity/work/data/116911421#Topic/intelligence_tests> ; # Intelligence Tests
    schema:about <http://experiment.worldcat.org/entity/work/data/116911421#Topic/tests_d_aptitude> ; # Tests d'aptitude
    schema:about <http://experiment.worldcat.org/entity/work/data/116911421#Topic/psychological_tests> ; # Psychological tests
    schema:about <http://experiment.worldcat.org/entity/work/data/116911421#Topic/stanford_binet_test> ; # Stanford-Binet Test
    schema:about <http://dewey.info/class/153.93/e19/> ;
    schema:bookFormat bgn:PrintBook ;
    schema:creator <http://viaf.org/viaf/27869356> ; # Lewis Madison Terman
    schema:datePublished "1919" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/116911421> ;
    schema:inLanguage "en" ;
    schema:name "The measurement of intelligence ; an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale."@en ;
    schema:productID "10088180" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/10088180#PublicationEvent/london_england_g_harrap_1919> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/116911421#Agent/g_harrap> ; # G. Harrap
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/10088180> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/116911421#CreativeWork/binet_simon_intelligence_scale> # Binet-Simon intelligence scale.
    a schema:CreativeWork ;
    schema:name "Binet-Simon intelligence scale." ;
    .

<http://experiment.worldcat.org/entity/work/data/116911421#Place/london_england> # London, England
    a schema:Place ;
    schema:name "London, England" ;
    .

<http://experiment.worldcat.org/entity/work/data/116911421#Topic/educational_tests_and_measurements> # Educational tests and measurements
    a schema:Intangible ;
    schema:name "Educational tests and measurements"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/116911421#Topic/intelligence_tests> # Intelligence Tests
    a schema:Intangible ;
    schema:name "Intelligence Tests"@en ;
    schema:name "Intelligence tests"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/116911421#Topic/psychological_tests> # Psychological tests
    a schema:Intangible ;
    schema:name "Psychological tests"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/116911421#Topic/stanford_binet_test> # Stanford-Binet Test
    a schema:Intangible ;
    schema:name "Stanford-Binet Test"@en ;
    .

<http://viaf.org/viaf/27869356> # Lewis Madison Terman
    a schema:Person ;
    schema:birthDate "1877" ;
    schema:deathDate "1956" ;
    schema:familyName "Terman" ;
    schema:givenName "Lewis Madison" ;
    schema:givenName "Lewis M." ;
    schema:name "Lewis Madison Terman" ;
    .

<http://www.worldcat.org/title/-/oclc/10088180>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/10088180> ; # The measurement of intelligence ; an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale.
    schema:dateModified "2018-08-05" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.