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  E-mail Message: I thought you might be interested in this item at http://www.worldcat.org/oclc/186102 Title: The measurement of intelligence; an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale, Author: Lewis M Terman Publisher: Boston, New York [etc.] Houghton Mifflin company [©1916] OCLC:186102

  
  

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The measurement of intelligence; an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale,

Author:	Lewis M Terman
Publisher:	Boston, New York [etc.] Houghton Mifflin company [©1916]
Series:	Riverside textbooks in education.
Edition/Format:	Book : EnglishView all editions and formats
Summary:	The constant and growing use of the Binet-Simon intelligence scale in public schools, institutions for defectives, reform schools, juvenile courts, and police courts is sufficient evidence of the intrinsic worth of the method. It is generally recognized, however, that the serviceableness of the scale has hitherto been seriously limited, both by the lack of a sufficiently detailed guide and by a number of recognized imperfections in the scale itself. The Stanford revision and extension has been worked out for the purpose of correcting as many as possible of these imperfections, and it is here presented with a rather minute description of the method as a whole and of the individual tests. The aim has been to present the explanations and instructions so clearly and in such an untechnical form as to make the book of use, not only to the psychologist, but also to the rank and file of teachers, physicians, and social workers. More particularly, it is designed as a text for use in normal schools, colleges, and teachers' reading-circles. (PsycINFO Database Record (c) 2004 APA, all rights reserved).  Read more...
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Subjects	Intelligence tests. Binet-Simon Test. Medidas De Inteligencia. View all subjects
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