skip to content
Measurement of the configuration of a concave surface by the interference of reflected light Preview this item
ClosePreview this item
Checking...

Measurement of the configuration of a concave surface by the interference of reflected light

Author: Tetsuo Kumazawa; Tatsuji Sakamoto; Shigeru Shida; United States. National Aeronautics and Space Administration.
Publisher: Washington, D.C. : National Aeronautics and Space Administration, [1985]
Series: NASA technical memorandum, 77796.
Edition/Format:   Book   Microform : National government publication : Microfiche : English
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

 

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Material Type: Government publication, National government publication
Document Type: Book
All Authors / Contributors: Tetsuo Kumazawa; Tatsuji Sakamoto; Shigeru Shida; United States. National Aeronautics and Space Administration.
OCLC Number: 234236769
Reproduction Notes: Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1985]. 1 microfiche.
Description: 1 volume.
Series Title: NASA technical memorandum, 77796.
Responsibility: Tetsuo Kumazawa, Tatsuji Sakamoto, and Shigeru Shida.

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/234236769> # Measurement of the configuration of a concave surface by the interference of reflected light
    a schema:CreativeWork, bgn:Microform, schema:Book ;
   library:oclcnum "234236769" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/140182180#Place/washington_d_c> ; # Washington, D.C.
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/dcu> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/140182180#Topic/reflection> ; # Reflection
   schema:about <http://experiment.worldcat.org/entity/work/data/140182180#Topic/numerical_analysis> ; # Numerical analysis
   schema:about <http://experiment.worldcat.org/entity/work/data/140182180#Topic/optical_paths> ; # Optical paths
   schema:about <http://experiment.worldcat.org/entity/work/data/140182180#Topic/semiconductor_devices> ; # Semiconductor devices
   schema:about <http://experiment.worldcat.org/entity/work/data/140182180#Topic/light_visible_radiation> ; # Light (visible radiation)
   schema:about <http://experiment.worldcat.org/entity/work/data/140182180#Topic/concavity> ; # Concavity
   schema:about <http://experiment.worldcat.org/entity/work/data/140182180#Topic/wave_diffraction> ; # Wave diffraction
   schema:about <http://experiment.worldcat.org/entity/work/data/140182180#Topic/surface_properties> ; # Surface properties
   schema:about <http://id.worldcat.org/fast/1046784> ; # Optical pattern recognition
   schema:contributor <http://experiment.worldcat.org/entity/work/data/140182180#Organization/united_states_national_aeronautics_and_space_administration> ; # United States. National Aeronautics and Space Administration.
   schema:contributor <http://experiment.worldcat.org/entity/work/data/140182180#Person/sakamoto_tatsuji> ; # Tatsuji Sakamoto
   schema:contributor <http://viaf.org/viaf/301062753> ; # Shigeru Shida
   schema:creator <http://experiment.worldcat.org/entity/work/data/140182180#Person/kumazawa_tetsuo> ; # Tetsuo Kumazawa
   schema:datePublished "1985" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/140182180> ;
   schema:genre "National government publication"@en ;
   schema:genre "Government publication"@en ;
   schema:inLanguage "en" ;
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/140182180#Series/nasa_technical_memorandum> ; # NASA technical memorandum ;
   schema:name "Measurement of the configuration of a concave surface by the interference of reflected light"@en ;
   schema:productID "234236769" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/234236769#PublicationEvent/washington_d_c_national_aeronautics_and_space_administration_1985> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/140182180#Agent/national_aeronautics_and_space_administration> ; # National Aeronautics and Space Administration
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/234236769> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/140182180#Agent/national_aeronautics_and_space_administration> # National Aeronautics and Space Administration
    a bgn:Agent ;
   schema:name "National Aeronautics and Space Administration" ;
    .

<http://experiment.worldcat.org/entity/work/data/140182180#Organization/united_states_national_aeronautics_and_space_administration> # United States. National Aeronautics and Space Administration.
    a schema:Organization ;
   schema:name "United States. National Aeronautics and Space Administration." ;
    .

<http://experiment.worldcat.org/entity/work/data/140182180#Person/kumazawa_tetsuo> # Tetsuo Kumazawa
    a schema:Person ;
   schema:familyName "Kumazawa" ;
   schema:givenName "Tetsuo" ;
   schema:name "Tetsuo Kumazawa" ;
    .

<http://experiment.worldcat.org/entity/work/data/140182180#Person/sakamoto_tatsuji> # Tatsuji Sakamoto
    a schema:Person ;
   schema:familyName "Sakamoto" ;
   schema:givenName "Tatsuji" ;
   schema:name "Tatsuji Sakamoto" ;
    .

<http://experiment.worldcat.org/entity/work/data/140182180#Place/washington_d_c> # Washington, D.C.
    a schema:Place ;
   schema:name "Washington, D.C." ;
    .

<http://experiment.worldcat.org/entity/work/data/140182180#Series/nasa_technical_memorandum> # NASA technical memorandum ;
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/234236769> ; # Measurement of the configuration of a concave surface by the interference of reflected light
   schema:name "NASA technical memorandum ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/140182180#Topic/light_visible_radiation> # Light (visible radiation)
    a schema:Intangible ;
   schema:name "Light (visible radiation)"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/140182180#Topic/semiconductor_devices> # Semiconductor devices
    a schema:Intangible ;
   schema:name "Semiconductor devices"@en ;
    .

<http://id.worldcat.org/fast/1046784> # Optical pattern recognition
    a schema:Intangible ;
   schema:name "Optical pattern recognition"@en ;
    .

<http://viaf.org/viaf/301062753> # Shigeru Shida
    a schema:Person ;
   schema:familyName "Shida" ;
   schema:givenName "Shigeru" ;
   schema:name "Shigeru Shida" ;
    .

<http://www.worldcat.org/title/-/oclc/234236769>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
   schema:about <http://www.worldcat.org/oclc/234236769> ; # Measurement of the configuration of a concave surface by the interference of reflected light
   schema:dateModified "2017-10-21" ;
   void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.