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Measuring, modeling, and reproducing material appearance : 3-4 February 2014, San Francisco, California, United States

Author: Maria V Ortiz Segovia; Philipp Urban; Jan P Allebach; SPIE (Society),; IS & T--the Society for Imaging Science and Technology,
Publisher: Bellingham, Washington : SPIE ; Springfield, Virginia : IS&T--The Society for Imaging Science and Technology, [2014]. ©2014
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 9018.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Summary:

Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

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Genre/Form: Electronic books
Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
(OCoLC)883429990
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Maria V Ortiz Segovia; Philipp Urban; Jan P Allebach; SPIE (Society),; IS & T--the Society for Imaging Science and Technology,
OCLC Number: 877436719
Description: 1 online resource : illustrations (some color).
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 9018.
Responsibility: Maria V. Ortiz Segovia, Philipp Urban, Jan P. Allebach, editors ; sponsored and published by IS&T--The Society for Imaging Science and Technology, SPIE.

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