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|Additional Physical Format:||Voyles, Paul Marriner, 1974-
Medium-range order in amorphous silicon measured by fluctuation electron microscopy
iv, 30 p.
|Material Type:||Document, Government publication, National government publication, Internet resource|
|Document Type:||Internet Resource, Computer File|
|All Authors / Contributors:||
P M Voyles; John Robert Abelson; National Renewable Energy Laboratory (U.S.)
|Notes:||Title from title screen (viewed June 7, 2004).|
|Details:||Mode of access: Internet from the NREL web site. Address as of 6/7/04: http://www.nrel.gov/docs/fy04osti/34826.pdf; current access available via PURL.|
|Series Title:||NREL/SR, 520-34826.|
|Responsibility:||P.M. Voyles and J.R. Abelson.|