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Medium-range order in amorphous silicon measured by fluctuation electron microscopy : final report, 23 June 1999-23 August 2002

Author: P M Voyles; John Robert Abelson; National Renewable Energy Laboratory (U.S.)
Publisher: Golden, Colo. : National Renewable Energy Laboratory, [2003]
Series: NREL/SR, 520-34826.
Edition/Format:   eBook : Document : National government publication : English
Database:WorldCat
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Additional Physical Format: Voyles, Paul Marriner, 1974-
Medium-range order in amorphous silicon measured by fluctuation electron microscopy
iv, 30 p.
(OCoLC)53970012
Material Type: Document, Government publication, National government publication, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: P M Voyles; John Robert Abelson; National Renewable Energy Laboratory (U.S.)
OCLC Number: 55606244
Notes: Title from title screen (viewed June 7, 2004).
Details: Mode of access: Internet from the NREL web site. Address as of 6/7/04: http://www.nrel.gov/docs/fy04osti/34826.pdf; current access available via PURL.
Series Title: NREL/SR, 520-34826.
Responsibility: P.M. Voyles and J.R. Abelson.

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