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Memory & LSI : digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey, sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE. Preview this item
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Memory & LSI : digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey, sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE.

Author: IEEE Computer Society.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: New York : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : Available from IEEE Computer Society Publications Office, [©1974]
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: IEEE Computer Society.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
OCLC Number: 1246752
Notes: "74CH0909-2C."
Description: 261 pages : illustrations ; 28 cm
Contents: The nature of modern terrorism / John Gearson --
The roots of terrorism: probing the myths / Karin Von Hippel --
The coming war on terrorism / Lawrence Freedman --
Finance warfare as a response to international terrorism / Martin S. Navias --
Responding to 11 September: detention without trial under the anti-terrorism, crime and security act 2001 / Helen Fenwick --
American hegemony: European dilemmas / William Wallace --
The eleventh of September and beyond: NATO / Anne Deighton --
The eleventh of September and beyond: the impact on the European Union / Charles Grant --
Russian-Western relations after 11 September: selective cooperation versus partnership (a Russian view) / Nadia Alexandrova Arbatova.

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<http://www.worldcat.org/oclc/1246752> # Memory & LSI : digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey, sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE.
    a schema:Book, schema:CreativeWork ;
    library:oclcnum "1246752" ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/3855290539#Place/long_beach_calif> ; # Long Beach, Calif.
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nyu> ;
    library:placeOfPublication <http://dbpedia.org/resource/New_York_City> ; # New York
    schema:about <http://experiment.worldcat.org/entity/work/data/3855290539#Topic/semiconductor_storage_devices_testing> ; # Semiconductor storage devices--Testing
    schema:about <http://id.worldcat.org/fast/975566> ; # Integrated circuits--Large scale integration
    schema:about <http://id.worldcat.org/fast/975593> ; # Integrated circuits--Testing
    schema:about <http://experiment.worldcat.org/entity/work/data/3855290539#Topic/integrated_circuits_testing> ; # Integrated circuits--Testing
    schema:about <http://id.worldcat.org/fast/1112185> ; # Semiconductor storage devices--Testing
    schema:about <http://dewey.info/class/621.38195833/e19/> ;
    schema:about <http://id.loc.gov/authorities/subjects/sh85067121> ; # Integrated circuits--Large scale integration
    schema:bookFormat bgn:PrintBook ;
    schema:contributor <http://viaf.org/viaf/145122972> ; # IEEE Computer Society.
    schema:contributor <http://viaf.org/viaf/125147174> ; # Institute of Electrical and Electronics Engineers. Philadelphia Section.
    schema:creator <http://experiment.worldcat.org/entity/work/data/3855290539#Meeting/semiconductor_test_symposium_5th_1974_cherry_hill_township_n_j> ; # Semiconductor Test Symposium (5th : 1974 : Cherry Hill Township, N.J.)
    schema:datePublished "1974" ;
    schema:description "The nature of modern terrorism / John Gearson -- The roots of terrorism: probing the myths / Karin Von Hippel -- The coming war on terrorism / Lawrence Freedman -- Finance warfare as a response to international terrorism / Martin S. Navias -- Responding to 11 September: detention without trial under the anti-terrorism, crime and security act 2001 / Helen Fenwick -- American hegemony: European dilemmas / William Wallace -- The eleventh of September and beyond: NATO / Anne Deighton -- The eleventh of September and beyond: the impact on the European Union / Charles Grant -- Russian-Western relations after 11 September: selective cooperation versus partnership (a Russian view) / Nadia Alexandrova Arbatova."@en ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/3855290539> ;
    schema:genre "Conference papers and proceedings"@en ;
    schema:genre "Conference publication"@en ;
    schema:inLanguage "en" ;
    schema:name "Memory & LSI : digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey, sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE."@en ;
    schema:productID "1246752" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/1246752#PublicationEvent/new_york_institute_of_electrical_and_electronics_engineers_long_beach_calif_available_from_ieee_computer_society_publications_office_1974> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/3855290539#Agent/available_from_ieee_computer_society_publications_office> ; # Available from IEEE Computer Society Publications Office
    schema:publisher <http://experiment.worldcat.org/entity/work/data/3855290539#Agent/institute_of_electrical_and_electronics_engineers> ; # Institute of Electrical and Electronics Engineers
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/1246752> ;
    .


Related Entities

<http://dbpedia.org/resource/New_York_City> # New York
    a schema:Place ;
    schema:name "New York" ;
    .

<http://experiment.worldcat.org/entity/work/data/3855290539#Agent/available_from_ieee_computer_society_publications_office> # Available from IEEE Computer Society Publications Office
    a bgn:Agent ;
    schema:name "Available from IEEE Computer Society Publications Office" ;
    .

<http://experiment.worldcat.org/entity/work/data/3855290539#Agent/institute_of_electrical_and_electronics_engineers> # Institute of Electrical and Electronics Engineers
    a bgn:Agent ;
    schema:name "Institute of Electrical and Electronics Engineers" ;
    .

<http://experiment.worldcat.org/entity/work/data/3855290539#Meeting/semiconductor_test_symposium_5th_1974_cherry_hill_township_n_j> # Semiconductor Test Symposium (5th : 1974 : Cherry Hill Township, N.J.)
    a bgn:Meeting, schema:Event ;
    schema:location <http://experiment.worldcat.org/entity/work/data/3855290539#Place/cherry_hill_township_n_j> ; # Cherry Hill Township, N.J.)
    schema:name "Semiconductor Test Symposium (5th : 1974 : Cherry Hill Township, N.J.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/3855290539#Place/cherry_hill_township_n_j> # Cherry Hill Township, N.J.)
    a schema:Place ;
    schema:name "Cherry Hill Township, N.J.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/3855290539#Place/long_beach_calif> # Long Beach, Calif.
    a schema:Place ;
    schema:name "Long Beach, Calif." ;
    .

<http://id.loc.gov/authorities/subjects/sh85067121> # Integrated circuits--Large scale integration
    a schema:Intangible ;
    schema:name "Integrated circuits--Large scale integration"@en ;
    .

<http://id.worldcat.org/fast/1112185> # Semiconductor storage devices--Testing
    a schema:Intangible ;
    schema:name "Semiconductor storage devices--Testing"@en ;
    .

<http://id.worldcat.org/fast/975566> # Integrated circuits--Large scale integration
    a schema:Intangible ;
    schema:name "Integrated circuits--Large scale integration"@en ;
    .

<http://id.worldcat.org/fast/975593> # Integrated circuits--Testing
    a schema:Intangible ;
    schema:name "Integrated circuits--Testing"@en ;
    .

<http://viaf.org/viaf/125147174> # Institute of Electrical and Electronics Engineers. Philadelphia Section.
    a schema:Organization ;
    schema:name "Institute of Electrical and Electronics Engineers. Philadelphia Section." ;
    .

<http://viaf.org/viaf/145122972> # IEEE Computer Society.
    a schema:Organization ;
    schema:name "IEEE Computer Society." ;
    .

<http://www.worldcat.org/title/-/oclc/1246752>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/1246752> ; # Memory & LSI : digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey, sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE.
    schema:dateModified "2018-05-29" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .

<http://www.worldcat.org/title/-/oclc/1246752#PublicationEvent/new_york_institute_of_electrical_and_electronics_engineers_long_beach_calif_available_from_ieee_computer_society_publications_office_1974>
    a schema:PublicationEvent ;
    schema:location <http://experiment.worldcat.org/entity/work/data/3855290539#Place/long_beach_calif> ; # Long Beach, Calif.
    schema:location <http://dbpedia.org/resource/New_York_City> ; # New York
    schema:organizer <http://experiment.worldcat.org/entity/work/data/3855290539#Agent/available_from_ieee_computer_society_publications_office> ; # Available from IEEE Computer Society Publications Office
    schema:organizer <http://experiment.worldcat.org/entity/work/data/3855290539#Agent/institute_of_electrical_and_electronics_engineers> ; # Institute of Electrical and Electronics Engineers
    schema:startDate "" ;
    .


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