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Metrology and Physical Mechanisms in New Generation Ionic Devices

Author: Umberto Celano
Publisher: Cham : Springer International Publishing : Imprint : Springer, 2016.
Series: Springer Theses, Recognizing Outstanding Ph. D. Research
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device  Read more...
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Genre/Form: Electronic books
Additional Physical Format: Printed edition:
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Umberto Celano
ISBN: 9783319395319 3319395319 9783319395302 3319395300
OCLC Number: 961869746
Description: 1 online resource (XXIV, 175 pages 96 illustrations, 18 illustrations in color. :) : online resource.
Contents: Introduction --
Filamentary-Based Resistive Switching --
Nanoscaled Electrical Characterization --
Conductive Filaments: Formation, Observation and Manipulation --
Three-Dimensional Filament Observation --
Reliability Threats in CBRAM --
Conclusions and Outlook.
Series Title: Springer Theses, Recognizing Outstanding Ph. D. Research
Responsibility: by Umberto Celano.

Abstract:

This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique  Read more...

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