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Microelectronic circuits

著者: Adel S Sedra; Kenneth C Smith
出版: New York : Oxford University Press, 2004.
シリーズ: Oxford series in electrical and computer engineering.
エディション/フォーマット:   book_printbook : CD for computer : English : 5th edすべてのエディションとフォーマットを見る
データベース:WorldCat
概要:
CD-ROM contains: free student version of PSpice 9.2 Lite Edition (SPICE simulator) and new industry-based design examples.
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Sedra, Adel S.
Microelectronic circuits.
New York : Oxford University Press, 2004
(OCoLC)795847117
資料の種類: インターネット資料
ドキュメントの種類: 図書, インターネットリソース
すべての著者/寄与者: Adel S Sedra; Kenneth C Smith
ISBN: 0195142519 9780195142518 0195142527 9780195142525 9780195338836 0195338839
OCLC No.: 53223719
物理形態: 1 volume (various pagings) : illustrations (some color) ; 26 cm + 1 CD-ROM (4 3/4 in.).
コンテンツ: Part I: Devices and basic circuits --
Introduction to electronics --
Operational amplifiers --
Diodes --
MOS field-effect transistors (MOSFETs) --
Bipolar junction transistors (BJTs) --
Part II: Analog and digital integrated circuits --
Single-state integrated-circuit amplifiers --
Differential and multistage amplifiers --
Feedback --
Operation-amplifier and data-coverter circuits --
Digital CMOS logic circuits --
Part III: Selected topics --
Memory and advanced digital circuits --
Filters and tuned amplifiers --
Signal generators and waveform-shaping circuits --
Output stages and power amplifiers --
Appendix A. VLSI fabrication technology --
Appendix B. Two-port network parameters --
Appendix C. Some useful network theorems --
Appendix D. Single-time-constant circuits --
Appendix E. s-Domain analysis: poles, zeros, and bode plots --
Appendix F. Bibliography --
Appendix G. Standard resistance values and unit prefixes --
Appendix H. Answers to selected problems.
シリーズタイトル: Oxford series in electrical and computer engineering.
責任者: Adel S. Sedra, Kenneth C. Smith.
その他の情報:

概要:

A textbook for third and fourth year students in all electrical and computer engineering departments taking electronic circuit courses. . Every chapter features a design problem that tests the  続きを読む

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