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  E-mail Message: I thought you might be interested in this item at http://www.worldcat.org/oclc/490007769 Title: Microelectronic reliability. / 2, Integrity, assessment and assurance Author: Emiliano Pollino Publisher: Norwood (MA) : Artech House, cop. 1989. ISBN/ISSN: 0890063508 9780890063507 OCLC:490007769

  
  

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• Semiconducteurs à l'arséniure de gallium -- Fiabilité.
• Semiconductors -- Reliability.
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Microelectronic reliability. / 2, Integrity, assessment and assurance

Author:	Emiliano Pollino
Publisher:	Norwood (MA) : Artech House, cop. 1989.
Edition/Format:	Book : English
Publication:	Microelectronic reliability, 2
Rating:	(not yet rated) 0 with reviews - Be the first.