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Microelectronic yield, reliability, and advanced packaging : 28-30 November 2000, Singapore

Author: Cher Ming Tan; Society of Photo-optical Instrumentation Engineers.; Nanyang Technological University.; Institute of Physics, Singapore.; et al
Publisher: Bellingham, Wash., USA : SPIE, ©2000.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 4229.
Edition/Format:   Book : Conference publication : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Congresses
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Cher Ming Tan; Society of Photo-optical Instrumentation Engineers.; Nanyang Technological University.; Institute of Physics, Singapore.; et al
ISBN: 0819439010 9780819439017
OCLC Number: 46342003
Description: xvii, 222 p. : ill. ; 28 cm.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 4229.
Responsibility: Cher Ming Tan ... [et al.], chairs/editors ; sponsored by Nanyang Technological University (Singapore) [and] SPIE--the International Society for Optical Engineering ; cooperating organizations, Institute of Physics (Singapore) ... [et al.].

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