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Microelectronics failure analysis : desk reference

Author: Richard J Ross; ASM International.; Electronic Device Failure Analysis Society.
Publisher: Materials Park, Ohio : ASM International, ©2011.
Edition/Format:   eBook : Document : English : 6th edView all editions and formats
Database:WorldCat
Summary:

Includes bibliographical references and index.

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Genre/Form: Electronic books
Handbooks, manuals, etc
Additional Physical Format: Print version:
Microelectronics failure analysis.
Materials Park, Ohio : ASM International, c2011
(OCoLC)701026679
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Richard J Ross; ASM International.; Electronic Device Failure Analysis Society.
ISBN: 9781613447598 1613447590 9781615037261 1615037268
OCLC Number: 771901447
Notes: "ASM International, 2011, no. 09110Z"--P. 4 of cover.
Some online versions lack accompanying media packaged with the printed version.
Description: 1 online resource (xi, 660 p.) : ill.
Contents: Section 1. Introduction --
section 2. Failure analysis process overviews --
section 3. Failure analysis topics --
section 4. Fault verification and classification --
section 5. Localization techniques --
section 6. Deprocessing and sample preparation --
section 7. Inspection --
section 8. Materials analysis --
section 9. Focused ion beam applications --
section 10. Management and reference information.
Other Titles: Microelectronics failure analysis desk reference
Responsibility: edited by Richard J. Ross ; EDFAS, ASM International.

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