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Microscopy and semiconducting materials 1995 : proceedings of the Institute of Physics conference held at Oxford University, 20-23 March 1995

Author: A G Cullis; A E Staton-Bevan
Publisher: Bristol ; Philadelphia : Institute of Physics Pub., ©1995.
Series: Institute of Physics conference series, no. 146.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Summary:

This volume continues the tradition of previous meetings in the series and provides researchers with an overview of recent developments in the field. It contains both invited review papers, as well  Read more...

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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Online version:
Microscopy and semiconducting materials 1995.
Bristol ; Philadelphia : Institute of Physics Pub., ©1995
(OCoLC)652256271
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: A G Cullis; A E Staton-Bevan
ISBN: 0750303476 9780750303477
OCLC Number: 34025045
Description: xvii, 795 pages : illustrations ; 24 cm.
Contents: Preface. High resolution microscopy (14 papers). Dislocations and grain boundaries (10 papers). Epitaxial layers (46 papers). Quantum wells and superlattices (12 papers). Bulk gallium arsenide and other compounds (11 papers). Processed silicon and diamond (19 papers). Silicides and metal-semiconductor contacts (8 papers). Device structures (17 papers). STM and AFM applications (7 papers). Advanced SEM and SOM applications (22 papers). Author and subject indexes.
Series Title: Institute of Physics conference series, no. 146.
Responsibility: edited by A.G. Cullis and A.E. Staton-Bevan.
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