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Microscopy of semiconducting materials 1991 : proceedings of the Institute of Physics conference held at Oxford University, 25-28 March 1991

Author: A G Cullis; N J Long; Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.; Royal Microscopical Society (Great Britain); Materials Research Society.
Publisher: Bristol ; Philadelphia : Institute of Physics, ©1991.
Series: Institute of Physics conference series, no. 117.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Summary:

This volume contains the invited and contributed papers presented at a conference which focused on recent developments in the microscopical studies of semiconductors. The techniques discussed  Read more...

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Genre/Form: Conference papers and proceedings
Oxford (1991)
Kongreß
Congresses
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: A G Cullis; N J Long; Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.; Royal Microscopical Society (Great Britain); Materials Research Society.
ISBN: 0854984062 9780854984060
OCLC Number: 24502022
Notes: Sponsored by the Electron Microscopy and Analysis Group of the Institute of Physics, the Royal Microscopical Society, and the Materials Research Society.
Description: xix, 801 pages : illustrations ; 24 cm.
Contents: High resolution microscopy (9 papers). Microanalysis (10 papers). Dislocations and grain boundaries (10 papers). Processed silicon (18 papers). Metal semiconductor contacts and silicides (17 papers). Bulk gallium arsenide and other compounds (12 papers). Epitaxial layers (31 papers). Quantum wells and superlattices (21 papers). X-ray studies (8 papers). Advanced scanning microscopy techniques (24 papers). Indexes.
Series Title: Institute of Physics conference series, no. 117.
Responsibility: edited by A.G. Cullis and N.J. Long.
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