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Microstructural characterization of materials

Author: D G Brandon; Wayne D Kaplan
Publisher: Chichester, England : John Wiley, ©2008.
Series: Quantitative software engineering series.
Edition/Format:   Book : English : 2nd edView all editions and formats
Database:WorldCat
Summary:
"The book is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this second edition of Microstructural Characterization of Materials explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis."  Read more...
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Details

Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: D G Brandon; Wayne D Kaplan
ISBN: 0470027843 9780470027844 0470027851 9780470027851
OCLC Number: 154798426
Description: xiv, 536 pages : illustrations (some color) ; 25 cm.
Contents: The concept of microstructure --
Microstructural features --
Crystallography & crystal structure --
Diffraction analysis of crystal structure --
Scattering Of radiation by crystals --
Reciprocal space --
X-ray diffraction methods --
Diffraction analysis --
Electron diffraction --
Optical microscopy --
Geometrical optics --
Construction of the microscope --
Specimen preparation --
Image contrast --
Working with digital images --
Resolution, contrast & image interpretation --
Transmission electron microscopy --
Basic principles --
Specimen preparation --
The origin of contrast --
Kinematic interpretation of diffraction contrast --
Dynamic diffraction & absorption effects --
Lattice imaging at high resolution --
Scanning transmission electron microscopy --
Scanning electron microscopy --
Components of the scanning electron microscope --
Electron beam --
specimen interactions --
Electron excitation of x-rays --
Back-scattered electrons --
Secondary Electron Emission --
Alternative Imaging Modes --
Specimen Preparation & Topology --
Focused Ion Beam Microscopy --
Microanalysis in electron microscopy --
X-Ray Microanalysis --
Electron Energy-Loss Spectroscopy --
Scanning probe microscopy & related techniques --
Surface Forces & Surface Morphology --
Scanning Probe Microscopes --
Field-ion Microscopy & Atom-Probe Tomography --
Chemical analysis of surface composition --
X-Ray Photoelectron Spectroscopy --
Auger Electron Spectroscopy --
Secondary-Ion Mass Spectrometry --
Quantitative & tomographic analysis of microstructure --
Basic Stereological Concepts --
Accessible & Inaccessible Parameters --
Optimizing accuracy --
Automated Image analysis --
Tomography & three dimensional reconstruction.
Series Title: Quantitative software engineering series.
Responsibility: David Brandon and Wayne D. Kaplan.

Abstract:

Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a  Read more...
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