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Modeling of optical thin films : 20-21 August 1987, San Diego, California

Author: Michael Ray Jacobson; Society of Photo-optical Instrumentation Engineers.; New Mexico State University. Applied Optics Laboratory.
Publisher: Bellingham, Wash. : SPIE, ©1987.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 821.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Online version:
Modeling of optical thin films.
Bellingham, Wash. : SPIE, ©1987
(OCoLC)701571029
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Michael Ray Jacobson; Society of Photo-optical Instrumentation Engineers.; New Mexico State University. Applied Optics Laboratory.
ISBN: 0892528567 9780892528561
OCLC Number: 17447903
Description: vi, 233 pages : illustrations ; 28 cm.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 821.
Responsibility: Michael Ray Jacobson, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations : Applied Optics Laboratory/New Mexico State University [and others].

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