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Modern optical characterization techniques for semiconductors and semiconductor devices

Author: O J Glembocki; Fred H Pollak; Jin-Joo Song; Society of Photo-optical Instrumentation Engineers.; Metallurgical Society (U.S.)
Publisher: Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, ©1987.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 794.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Online version:
Modern optical characterization techniques for semiconductors and semiconductor devices.
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, ©1987
(OCoLC)573106669
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: O J Glembocki; Fred H Pollak; Jin-Joo Song; Society of Photo-optical Instrumentation Engineers.; Metallurgical Society (U.S.)
ISBN: 089252829X 9780892528295
OCLC Number: 16637798
Notes: "26-27 March 1987, Bay Point, Florida."
Description: vi, 282 pages : illustrations ; 28 cm.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 794.
Responsibility: O.J. Glembocki, Fred H. Pollak, J.J. Song, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating sponsor, the Metallurgical Society.

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Primary Entity

<http://www.worldcat.org/oclc/16637798> # Modern optical characterization techniques for semiconductors and semiconductor devices
    a schema:CreativeWork, schema:Book ;
    library:oclcnum "16637798" ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/365616793#Place/bellingham_wash_usa> ; # Bellingham, Wash., USA
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/wau> ;
    schema:about <http://dewey.info/class/621.3817/e19/> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/365616793#Topic/thin_films_optical_properties> ; # Thin films--Optical properties
    schema:about <http://id.worldcat.org/fast/1150011> ; # Thin film devices
    schema:about <http://experiment.worldcat.org/entity/work/data/365616793#Topic/thin_film_devices> ; # Thin film devices
    schema:about <http://id.worldcat.org/fast/1150034> ; # Thin films--Optical properties
    schema:bookFormat bgn:PrintBook ;
    schema:contributor <http://viaf.org/viaf/55374123> ; # Jin-Joo Song
    schema:contributor <http://viaf.org/viaf/127619765> ; # Society of Photo-optical Instrumentation Engineers.
    schema:contributor <http://experiment.worldcat.org/entity/work/data/365616793#Person/glembocki_o_j> ; # O. J. Glembocki
    schema:contributor <http://viaf.org/viaf/53097277> ; # Fred H. Pollak
    schema:contributor <http://viaf.org/viaf/140801814> ; # Metallurgical Society (U.S.)
    schema:copyrightYear "1987" ;
    schema:datePublished "1987" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/365616793> ;
    schema:genre "Conference publication"@en ;
    schema:genre "Conference papers and proceedings"@en ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/365616793#Series/proceedings_of_spie_the_international_society_for_optical_engineering> ; # Proceedings of SPIE--the International Society for Optical Engineering ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/573106669> ;
    schema:name "Modern optical characterization techniques for semiconductors and semiconductor devices"@en ;
    schema:productID "16637798" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/16637798#PublicationEvent/bellingham_wash_usa_spie_the_international_society_for_optical_engineering_1987> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/365616793#Agent/spie_the_international_society_for_optical_engineering> ; # SPIE--the International Society for Optical Engineering
    schema:workExample <http://worldcat.org/isbn/9780892528295> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/16637798> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/365616793#Agent/spie_the_international_society_for_optical_engineering> # SPIE--the International Society for Optical Engineering
    a bgn:Agent ;
    schema:name "SPIE--the International Society for Optical Engineering" ;
    .

<http://experiment.worldcat.org/entity/work/data/365616793#Person/glembocki_o_j> # O. J. Glembocki
    a schema:Person ;
    schema:familyName "Glembocki" ;
    schema:givenName "O. J." ;
    schema:name "O. J. Glembocki" ;
    .

<http://experiment.worldcat.org/entity/work/data/365616793#Place/bellingham_wash_usa> # Bellingham, Wash., USA
    a schema:Place ;
    schema:name "Bellingham, Wash., USA" ;
    .

<http://experiment.worldcat.org/entity/work/data/365616793#Series/proceedings_of_spie_the_international_society_for_optical_engineering> # Proceedings of SPIE--the International Society for Optical Engineering ;
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/16637798> ; # Modern optical characterization techniques for semiconductors and semiconductor devices
    schema:name "Proceedings of SPIE--the International Society for Optical Engineering ;" ;
    .

<http://id.worldcat.org/fast/1150011> # Thin film devices
    a schema:Intangible ;
    schema:name "Thin film devices"@en ;
    .

<http://id.worldcat.org/fast/1150034> # Thin films--Optical properties
    a schema:Intangible ;
    schema:name "Thin films--Optical properties"@en ;
    .

<http://viaf.org/viaf/127619765> # Society of Photo-optical Instrumentation Engineers.
    a schema:Organization ;
    schema:name "Society of Photo-optical Instrumentation Engineers." ;
    .

<http://viaf.org/viaf/140801814> # Metallurgical Society (U.S.)
    a schema:Organization ;
    schema:name "Metallurgical Society (U.S.)" ;
    .

<http://viaf.org/viaf/53097277> # Fred H. Pollak
    a schema:Person ;
    schema:familyName "Pollak" ;
    schema:givenName "Fred H." ;
    schema:name "Fred H. Pollak" ;
    .

<http://viaf.org/viaf/55374123> # Jin-Joo Song
    a schema:Person ;
    schema:familyName "Song" ;
    schema:givenName "Jin-Joo" ;
    schema:name "Jin-Joo Song" ;
    .

<http://worldcat.org/isbn/9780892528295>
    a schema:ProductModel ;
    schema:isbn "089252829X" ;
    schema:isbn "9780892528295" ;
    .

<http://www.worldcat.org/oclc/573106669>
    a schema:CreativeWork ;
    rdfs:label "Modern optical characterization techniques for semiconductors and semiconductor devices." ;
    schema:description "Online version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/16637798> ; # Modern optical characterization techniques for semiconductors and semiconductor devices
    .

<http://www.worldcat.org/title/-/oclc/16637798>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/16637798> ; # Modern optical characterization techniques for semiconductors and semiconductor devices
    schema:dateModified "2016-10-11" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


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