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Multiple diffraction of x-rays in crystals

Author: Shih-Lin Chang
Publisher: Berlin ; New York : Springer-Verlag, 1984.
Series: Springer series in solid-state sciences, 50.
Edition/Format:   Print book : EnglishView all editions and formats
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Additional Physical Format: Online version:
Chang, Shih-Lin, 1946-
Multiple diffraction of x-rays in crystals.
Berlin ; New York : Springer-Verlag, 1984
(OCoLC)624490246
Document Type: Book
All Authors / Contributors: Shih-Lin Chang
ISBN: 0387129553 9780387129556 3540129553 9783540129554
OCLC Number: 10948601
Description: xi, 300 pages : illustrations ; 24 cm.
Contents: 1. Introduction.- 2. Geometry, Peak Indexing, and Experimental Techniques.- 2.1 Geometry of Multiple Diffraction.- 2.1.1 Real-Space and Reciprocal-Space Representations.- 2.1.2 Persistent and Coincidental Multiple Diffractions.- 2.1.3 Lattice-Symmetry Dependence-Intrinsic Multiple Diffraction.- 2.1.4 Multiple-Diffraction Possibilities.- 2.1.5 Decomposition of Multiple Diffraction.- 2.2 Experimental Techniques for Obtaining Multiple Diffraction.- 2.2.1 Collimated-Beam Technique.- 2.2.2 Divergent-Beam Techniques.- 2.3 Indexing Multiple Diffraction Patterns.- 2.3.1 Reference Vector Method.- 2.3.2 Orientation Matrix Method.- 2.4 Indexing Kossel Patterns.- 2.4.1 Stereographic Projection Method.- 2.4.2 Combined Gnomonic-Stereographic Projection Method.- 3. Kinematical Theory of Diffraction.- 3.1 Equation of Power Transfer for Multi-Beam Cases.- 3.2 Approximate Solutions to the Equation of Power Transfer.- 3.3 Integrated Intensity and the Lorentz-Polarization Factors.- 3.4 Path Lengths of X-Ray Beams in Crystals.- 3.5 Exact Solution to the Power-Transfer Equation.- 3.6 Iterative Calculation for Reflection Power.- 3.7 Dynamical Treatment for Kinematical Reflections.- 3.8 Diffraction in Multi-Layered Crystals.- 3.9 Peak Width, Beam Divergence, and Mosaic Spread.- 4. Dynamical Theory of X-Ray Diffraction.- 4.1 Fundamental Equation of Wavefields.- 4.2 Polarization of Wavefields.- 4.3 Dispersion Surface.- 4.3.1 Geometry of the Dispersion Surface.- 4.3.2 Excitation of the Dispersion Surface.- 4.4 Energy Flow.- 4.4.1 Poynting Vectors and the Dispersion Surface.- 4.4.2 Group Velocity and Energy Flow.- 4.5 Modes of Wave Propagation.- 4.5.1 Wavefields of Modes.- 4.5.2 Number of Permitted Modes.- 4.6 Absorption.- 4.7 Boundary Conditions.- 4.8 Excitation of Mode and Excitation of Beam.- 4.9 Intensity of Wavefield (Standing-Wave) in Crystal.- 4.10 Consideration of the Spherical-Wave Nature of the Incident X-Rays.- 5. Approximations, Numerical Computing, and Other Approaches.- 5.1 Two-Beam Approximation for Three-Beam Diffraction.- 5.1.1 General Considerations.- 5.1.2 Three-Beam Transmission Case (Borrmann Diffraction).- 5.1.3 Diffracted Intensity of Three-Beam Bragg Reflection.- 5.1.4 Integrated Reflection for Non-Absorbing Crystals.- 5.1.5 Diffraction in Absorbing Crystals.- 5.2 Procedures for Numerical Computing.- 5.3 Quantum Mechanical Approach.- 5.4 N-Beam Diffraction in Other Types of Interaction.- 5.4.1 Two-Beam Diffraction with Specular Reflection.- 5.4.2 Interaction of X-Rays with Phonons.- 6. Case Studies.- 6.1 Bragg-Type Multiple Diffraction from Gallium Arsenide, Indium Arsenide and Indium Phosphide-Kinematical Interpretation.- 6.2 Three-Beam Borrmann Diffraction-Dynamical Calculation.- 6.3 Simultaneous Four-Beam Borrmann Diffraction.- 6.4 Three-Beam Bragg-Laue and Bragg-Bragg Diffraction.- 6.5 Four-Beam Bragg-Laue Diffraction.- 7. Applications.- 7.1 Experimental Determination of X-Ray Reflection Phases; Application to Crystal Structure Determination.- 7.1.1 General Consideration of the X-Ray Phase Problem.- 7.1.2 Reflection Phases and Multiple Diffraction.- 7.1.3 Experimental Methods for Phase Determination Using Multiple Diffraction.- 7.1.4 Determination of Centrosymmetric Crystal Structures in Practice.- 7.1.5 Phase Determination for Non-Centrosymmetric Crystals.- 7.2 Determination of Lattice Constants of Single Crystals.- 7.2.1 Divergent-Beam Photographic Methods.- 7.2.2 Collimated-Beam Method.- 7.3 Determination of Lattice Mismatch in Thin Layered Materials.- 7.4 Multi-Beam X-Ray Topography.- 7.5 Multi-Beam X-Ray Interferometer.- 7.6 Monochromatization of X-Ray Beams.- 7.7 Plasma Diagnosis.- 7.8 Determination of Mosaic Spread of Crystals.- 7.9 Multi-Beam X-Ray Standing-Wave Excited Fluorescence Technique for Surface Studies-A Proposed Method.- 7.10 Possible Future Trend of Development.- References.
Series Title: Springer series in solid-state sciences, 50.
Responsibility: Shih-Lin Chang.

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