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Détails
| Type d’ouvrage : | Ressource Internet |
|---|---|
| Format : | Livre, Ressource Internet |
| Tous les auteurs / collaborateurs : |
John L Hutchison; Augus I Kirkland |
| ISBN : | 9780854042418 0854042415 |
| Numéro OCLC : | 254089186 |
| Notes : | Literaturangaben. |
| Description : | XIII, 304 S : ill., graph. Darst. |
| Contenu : | Chapter 1: Characterization of Nanomaterials using Transmission Electron Microscopy; 1.1 Introduction; 1.2 Imaging; 1.2.1 Transmission Electron Microscopy; 1.2.2 High-resolution electron Microscopy; 1.2.3 Basis of High-resolution Imaging; 1.2.4 Resolution Limits; 1.2.5 Lattice Imaging or Atomic Imaging; 1.2.6 Instrumental Parameters; 1.3 Survey of Applications; 1.3.1 Developments in HREM; 1.3.2 Small Particles and Precipitates; 1.3.3 Two-dimensional Objects; 1.3.4 One-dimensional Objects; 1.3.5 Zero-dimensional Objects; 1.3.6 Surfaces and Interfaces; 1.4 Emerging Trends and Practical Concerns; 1.4.1 Atomic Location and Quantitative Imaging; 1.4.2 Detection and Correction of Aberrations; 1.4.3 Stobbs' Factor; 1.4.4 Radiation Damage; 1.5 Conclusions; Acknowledgements; References; Chapter 2: Scanning Transmission Electron Microscopy; 2.1 Introduction; 2.1.1 Basic Description; 2.1.2 Detectors; 2.1.3 Electron Energy-loss Spectroscopy; 2.2 Aberration-corrected STEM; 2.2.1 The Aberration Function; 2.2.2 Spherical and Chromatic Aberration; 2.2.3 Aberration Correctors; 2.2.4 What Do We See in a STEM?; 2.2.5 Measuring Aberrations; 2.2.6 Phonons; 2.2.7 Resolution; 2.2.8 Three-dimensional Microscopy; 2.2.9 Channeling; 2.3 Applications to Nanostructure Characterisation in Catalysis; 2.3.1 Anomalous Pt-Pt Distances in the Pt/alumina Catalytic Systems; 2.3.2 La Stabilisation of Catalytic Supports; 2.3.3 CO Oxidation by Supported Noble-metal Nanoparticles; 2.4 Summary and Outlook; Acknowledgements; References; Chapter 3: Scanning Tunneling Microscopy of Surfaces and Nanostructures; 3.1 History of the STM; 3.2 The Tunneling Interaction and Basic Operating Principles of STM; 3.3 Atomic-resolution Imaging of Surface Reconstructions; 3.4 Imaging of Surface Nanostructures; 3.5 Manipulation of Adsorbed Atoms and Molecules; 3.6 Influence of the Surface Electronic States on STM Images; 3.7 Tunneling Spectroscopy; 3.8 Tip Artefacts in STM Imaging; 3.9 Conclusions; References; Chapter 4: Electron Energy-loss Spectroscopy and Energy Dispersive X-ray Analysis; 4.1 What is Nanoanalysis?; 4.2 Nanoanalysis in the Electron Microscope; 4.2.1 General Instrumentation; 4.3 X-ray Analysis in the TEM; 4.3.1 Basics of X-ray Analysis; 4.3.2 Analysis and Quantification of X-ray Emission Spectra; 4.3.3 Application to the Analysis of Nanometre Volumes in the S/TEM; 4.3.4 Related Photon Emission Techniques in the TEM; 4.4 Basics of EELS; 4.4.1 Instrumentation for EELS; 4.4.2 Basics of the EEL Spectrum; 4.4.3 Quantification of EELS - The Determination of Chemical Composition; 4.4.4 Determination of Electronic Structure and Bonding; 4.4.5 Application to the Analysis of Nanometre Volumes in the S/TEM; 4.5 EELS Imaging; 4.6 Radiation Damage; 4.7 Emerging Techniques; 4.8 Conclusions; References; Chapter 5: Electron Holography of Nanostructured Materials; 5.1.1 Basis of Off-axis Electron Holography; 5.1.2 Experimental Considerations; 5.2 The Mean Inner Potential Contribution to the Phase Shift; 5.3 Measurement of Magnetic Fields; 5.3.1 Early Experiments; 5.3.2 Experiments Involving Digital Acquisition and Analysis; 5.4 Measurement of Electrostatic Fields; 5.4.1 Electrically Biased Nanowires; 5.4.2 Dopant Potentials in Semiconductors; 5.4.3 Space-charge Layers at Grain Boundaries; 5.5 High resolution Electron Holography; 5.6 Alternative Forms of Electron Holography; 5.7 Discussion, Prospects for the Future and Conclusions; Acknowledgements; References; Chapter 6: Electron Tomography; 6.1 Introduction; 6.2 Theory of Electron Tomography; 6.2.1 From Projection to Reconstruction; 6.2.2 Backprojection: Real-space Reconstruction; 6.2.3 Constrained Reconstructions; 6.2.4 Reconstruction Resolution; 6.2.5 Measuring Reconstruction Resolution; 6.2.6 The Projection Requirement; 6.3 Acquiring Tilt Series; 6.3.1 Instrumental Considerations; 6.3.2 Specimen Support and Positioning; 6.3.3 Specimen Considerations; 6.4 Alignment of Tilt Series; 6.4.1 Alignment by Tracking of Fiducial Markers; 6.4.2 Alignment by Crosscorrelation; 6.4.3 Rotational Alignment without Fiducial Markers; 6.4.4 Other Markerless Alignment Techniques; 6.5 Visualisation, Segmentation and Data Mining; 6.5.1 Visualisation Techniques; 6.5.2 Volume Rendering; 6.5.3 Segmentation; 6.5.4 Quantitative Analysis; 6.6 Imaging Modes; 6.6.1 Bright-field TEM; 6.6.2 Dark-field (DF) Tomography; 6.6.3 HAADF STEM; 6.6.4 Meeting the Projection Requirement; 6.6.5 Experimental Considerations; 6.6.6 Limitations; 6.6.7 Core-loss (Chemical Mapping) EFTEM; 6.6.8 Low-loss EFTEM; 6.6.9 Energy Dispersive X-ray (EDX) Mapping; 6.6.10 Holographic Tomography; 6.7 New Techniques; 6.7.1 Electron Energy-loss Spectroscopy (EELS) Spectrum Imaging; 6.7.2 Confocal STEM; 6.7.3 Atomistic Tomography; 6.8 Conclusions; References; Chapter 7: In-situ Environmental (Scanning) Transmission Electron Microscopy; 7.1 Introduction; 7.2 Background; 7.3 Recent Advances in Atomic-resolution In-situ ETEM; 7.4 Impact of the Atomic-resolution In-situ ETEM and Global Applications; 7.5 Applications of Atomic-resolution In-situ ETEM in the Studies of Gas-Catalyst and Liquid-Catalyst Reactions; 7.5.1 Liquid-phase Hydrogenation and Polymerisation Reactions; 7.5.2 Development of Nanocatalysts for Novel Hydrogenation Chemistry and Dynamic Imaging of Desorbed Organic Products in Liquid-phase Reactions; 7.5.3 Butane Oxidation Technology; 7.5.4 In-situ Observations of Carbon Nanotubes (CNTs) in Chemical and Thermal Environments; 7.6 Conclusions; Acknowledgements; References; Subject Index; |
| Titre de collection : | RSC nanoscience & nanotechnology. |
| Responsabilité : | ed. by Augus I. Kirkland and John L. Hutchison. |
| Plus d’informations : |
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Synopsis de l’éditeur
A very interesting and useful publication indeed, with a content according to a very high scientific standard. -- FOD WASO Laboratorium FOD WASO Laboratorium This text contains very well-referenced chapters on the newest advances in nanoscale imaging and microscopy and would be a welcome addition to the shelf of any research microscopist who wishes to venture beyond the conventional boundaries of these techniques. -- Chemistry World, January 2008, 66 (Ed Gillan) Chemistry World A very interesting and useful publication indeed, with a content according to a very high scientific standard. This text contains very well-referenced chapters on the newest advances in nanoscale imaging and microscopy and would be a welcome addition to the shelf of any research microscopist who wishes to venture beyond the conventional boundaries of these techniques. Lire la suite...
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