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Nanoscale spectroscopy and its applications to semiconductor research

Author: Yoshio Watanabe
Publisher: Berlin ; Heidelberg : Springer, 2002.
Series: Lecture notes in physics, 588.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Summary:
Fabrication technologies for nanostructured devices have be- en developed recently, and the electrical and optical pro- perties of such nanostructures are a subject of advanced re- search. This book describes the different approaches to spectroscopic microscopy, i.e., electron beam probe spec- troscopy, spectroscopic photoelectron microscopy, and scan- ning probe spectroscopy. It will be useful as a compact source  Read more...
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Genre/Form: Electronic books
Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
Nanoscale spectroscopy and its applications to semiconductor research
(OCoLC)49383791
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Yoshio Watanabe
ISBN: 9783540458500 3540458506
OCLC Number: 50505530
Description: 1 online resource (xv, 306 pages) : illustrations.
Contents: Spectroscopy Using an Electron Microscope --
Synchrotron Radiation Nanospectroscopy --
Scanning Probe Spectroscopy.
Series Title: Lecture notes in physics, 588.
Responsibility: Y. Watanabe [and others].

Abstract:

Using a tutorial approach, this book describes the different approaches to spectroscopic microscopy, Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe  Read more...

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"This is an unusual collection and the vast audience of workers on semiconductor structure will want to have access to it." (Ultramicroscopy, 99, 2004)

 
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