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Nanostructure science, metrology, and technology : 5-7 September 2001, Gaithersburg, USA

Author: Martin Charles PeckerarMichael T PostekSociety of Photo-optical Instrumentation Engineers.National Institute of Standards and Technology (U.S.)United States. Office of Naval Research.All authors
Publisher: Bellingham, Wash. : SPIE-the International Society for Optical Engineering, ©2002.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 4608.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: (OCoLC)50514238
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Martin Charles Peckerar; Michael T Postek; Society of Photo-optical Instrumentation Engineers.; National Institute of Standards and Technology (U.S.); United States. Office of Naval Research.; SPIE Digital Library.
ISBN: 0819443476 9780819443472
OCLC Number: 53837550
Notes: "Sponsored by SPIE-the International Society for Optical Engineering, National Institute of Standards and Technology (USA), Office of Naval Research (USA)."
Reproduction Notes: Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2003. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.
Description: x, 278 pages : illustrations ; 28 cm.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 4608.
Responsibility: Martin C. Peckerar, Michael T. Postek, Jr., chairs/editors.

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