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Near-field characterization of micro/nano-scaled fluid flows

Author: Kenneth D Kihm
Publisher: Berlin : Springer-Verlag, ©2011.
Series: Experimental fluid mechanics.
Edition/Format:   Print book : EnglishView all editions and formats
Summary:

This monograph presents a number of label-free, fully developed and tested experimental techniques for characterizing near-field fluid flow, including total internal reflection microscopy, optical  Read more...

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Document Type: Book
All Authors / Contributors: Kenneth D Kihm
ISBN: 9783642204258 3642204252
OCLC Number: 727704156
Description: viii, 148 pages : illustrations (some color) ; 24 cm.
Contents: Preface1. Introduction1.1 Definitions of near-field1.1.1 Evanescent wave penetration depth1.1.3 Photon penetration skin-depth into metal1.1.4 Penetration depth of no-slip boundary conditions1.1.5 Equilibrium height (hm) for small particles under near-field forces 1.2 Synopsis 2. Total Internal Reflection Microscopy (TIRM)2.1 Principles and configuration of TIRM2.2 Ratiometric TIRM imaging analysis 2. 3 Near-field applications of TIRM2.3.1 Near-wall hindered Brownian motion of nanoparticles2.3.2 Slip-flows in the near-field2.3.3 Cytoplasmic viscosity and intracellular vesicle sizes 3. Optical Serial Sectioning Microscopy (OSSM)3.1 Point spread functions (PSFs) under aberration-free design conditions3.2 Point spread functions (PSFs) under off-design conditions3.3 Principles of OSSM3.4 Near-field applications of OSSM3.4.1 Three-dimensional particle tracking velocimetry (PTV)3.4.2 Near-wall thermometry3.4.3 Near-field mixture concentration measurements 4. Confocal Laser Scanning Microscopy (CLSM) 4.1 Principles of confocal imaging4.2 Microscopic imaging resolutions4.3 Confocal microscopic imaging resolutions 4.4 Optical slicing thickness of confocal microscopy4.5 Confocal laser scanning microscopic particle imaging velocimetry (CLSM-PIV) system4.6 Near-field applications of CLSM-PIV4.6.1 Poiseuille flows in a microtube 4.6.2 Microscale rotating Couette flows4.6.3 Moving bubbles in a microchannel 5. Surface Plasmon Resonance Microscopy (SPRM)5.1 Surface plasmon polaritons (SPPs)5.2 Dispersion of SPPs5.3. Kretschmann's three-layer configuration5.4 Surface plasmon resonance (SPR) reflectance5.5 Surface plasmon resonance microscopy (SPRM) imaging systems5.6 Selection of a prism for SPRM5.7 SPR reflectance imaging resolution5.8 Near-field applications of SPRM5.8.1 History and uses of SPRM5.8.2 Label-free mapping of microfluidic mixing fields5.8.3 Near-field mapping of salinity diffusion5.8.4 Dynamic monitoring of nanoparticle concentration profiles5.8.5 Unveiling the fingerprints of nanocrystalline self-assembly5.8.6 Near-wall thermometry 6. Reflection Interference Contrast Microscopy (RICM)6.1 Interference of plane waves6.2 Principles and practical issues of RICM6.3 Near-field applications of RICM6.3.1 Thin-film thickness measurements6.3.2 Electrohydrodynamic (EHD) control of thin liquid film6.3.3 Dynamic fingerprinting of live-cell focal contacts References1. Introduction1.1 Definitions of near-field1.1.1 Evanescent wave penetration depth1.1.3 Photon penetration skin-depth into metal1.1.4 Penetration depth of no-slip boundary conditions1.1.5 Equilibrium height (hm) for small particles under near-field forces 1.2 Synopsis 2. Total Internal Reflection Microscopy (TIRM)2.1 Principles and configuration of TIRM2.2 Ratiometric TIRM imaging analysis 2. 3 Near-field applications of TIRM2.3.1 Near-wall hindered Brownian motion of nanoparticles2.3.2 Slip-flows in the near-field2.3.3 Cytoplasmic viscosity and intracellular vesicle sizes 3. Optical Serial Sectioning Microscopy (OSSM)3.1 Point spread functions (PSFs) under aberration-free design conditions3.2 Point spread functions (PSFs) under off-design conditions3.3 Principles of OSSM3.4 Near-field applications of OSSM3.4.1 Three-dimensional particle tracking velocimetry (PTV)3.4.2 Near-wall thermometry3.4.3 Near-field mixture concentration measurements 4. Confocal Laser Scanning Microscopy (CLSM) 4.1 Principles of confocal imaging4.2 Microscopic imaging resolutions4.3 Confocal microscopic imaging resolutions 4.4 Optical slicing thickness of confocal microscopy4.5 Confocal laser scanning microscopic particle imaging velocimetry (CLSM-PIV) system4.6 Near-field applications of CLSM-PIV4.6.1 Poiseuille flows in a microtube 4.6.2 Microscale rotating Couette flows4.6.3 Moving bubbles in a microchannel 5. Surface Plasmon Resonance Microscopy (SPRM)5.1 Surface plasmon polaritons (SPPs)5.2 Dispersion of SPPs5.3. Kretschmann's three-layer configuration5.4 Surface plasmon resonance (SPR) reflectance5.5 Surface plasmon resonance microscopy (SPRM) imaging systems5.6 Selection of a prism for SPRM5.7 SPR reflectance imaging resolution5.8 Near-field applications of SPRM5.8.1 History and uses of SPRM5.8.2 Label-free mapping of microfluidic mixing fields5.8.3 Near-field mapping of salinity diffusion5.8.4 Dynamic monitoring of nanoparticle concentration profiles5.8.5 Unveiling the fingerprints of nanocrystalline self-assembly5.8.6 Near-wall thermometry 6. Reflection Interference Contrast Microscopy (RICM)6.1 Interference of plane waves6.2 Principles and practical issues of RICM6.3 Near-field applications of RICM6.3.1 Thin-film thickness measurements6.3.2 Electrohydrodynamic (EHD) control of thin liquid film6.3.3 Dynamic fingerprinting of live-cell focal contacts References3.1 Point spread functions (PSFs) under aberration-free design conditions3.2 Point spread functions (PSFs) under off-design conditions3.3 Principles of OSSM3.4 Near-field applications of OSSM3.4.1 Three-dimensional particle tracking velocimetry (PTV)3.4.2 Near-wall thermometry3.4.3 Near-field mixture concentration measurements 4. Confocal Laser Scanning Microscopy (CLSM) 4.1 Principles of confocal imaging4.2 Microscopic imaging resolutions4.3 Confocal microscopic imaging resolutions 4.4 Optical slicing thickness of confocal microscopy4.5 Confocal laser scanning microscopic particle imaging velocimetry (CLSM-PIV) system4.6 Near-field applications of CLSM-PIV4.6.1 Poiseuille flows in a microtube 4.6.2 Microscale rotating Couette flows4.6.3 Moving bubbles in a microchannel 5. Surface Plasmon Resonance Microscopy (SPRM)5.1 Surface plasmon polaritons (SPPs)5.2 Dispersion of SPPs5.3. Kretschmann's three-layer configuration5.4 Surface plasmon resonance (SPR) reflectance5.5 Surface plasmon resonance microscopy (SPRM) imaging systems5.6 Selection of a prism for SPRM5.7 SPR reflectance imaging resolution5.8 Near-field applications of SPRM5.8.1 History and uses of SPRM5.8.2 Label-free mapping of microfluidic mixing fields5.8.3 Near-field mapping of salinity diffusion5.8.4 Dynamic monitoring of nanoparticle concentration profiles5.8.5 Unveiling the fingerprints of nanocrystalline self-assembly5.8.6 Near-wall thermometry 6. Reflection Interference Contrast Microscopy (RICM)6.1 Interference of plane waves6.2 Principles and practical issues of RICM6.3 Near-field applications of RICM6.3.1 Thin-film thickness measurements6.3.2 Electrohydrodynamic (EHD) control of thin liquid film6.3.3 Dynamic fingerprinting of live-cell focal contacts References4.2 Microscopic imaging resolutions4.3 Confocal microscopic imaging resolutions 4.4 Optical slicing thickness of confocal microscopy4.5 Confocal laser scanning microscopic particle imaging velocimetry (CLSM-PIV) system4.6 Near-field applications of CLSM-PIV4.6.1 Poiseuille flows in a microtube 4.6.2 Microscale rotating Couette flows4.6.3 Moving bubbles in a microchannel 5. Surface Plasmon Resonance Microscopy (SPRM)5.1 Surface plasmon polaritons (SPPs)5.2 Dispersion of SPPs5.3. Kretschmann's three-layer configuration5.4 Surface plasmon resonance (SPR) reflectance5.5 Surface plasmon resonance microscopy (SPRM) imaging systems5.6 Selection of a prism for SPRM5.7 SPR reflectance imaging resolution5.8 Near-field applications of SPRM5.8.1 History and uses of SPRM5.8.2 Label-free mapping of microfluidic mixing fields5.8.3 Near-field mapping of salinity diffusion5.8.4 Dynamic monitoring of nanoparticle concentration profiles5.8.5 Unveiling the fingerprints of nanocrystalline self-assembly5.8.6 Near-wall thermometry 6. Reflection Interference Contrast Microscopy (RICM)6.1 Interference of plane waves6.2 Principles and practical issues of RICM6.3 Near-field applications of RICM6.3.1 Thin-film thickness measurements6.3.2 Electrohydrodynamic (EHD) control of thin liquid film6.3.3 Dynamic fingerprinting of live-cell focal contacts References5.5 Surface plasmon resonance microscopy (SPRM) imaging systems5.6 Selection of a prism for SPRM5.7 SPR reflectance imaging resolution5.8 Near-field applications of SPRM5.8.1 History and uses of SPRM5.8.2 Label-free mapping of microfluidic mixing fields5.8.3 Near-field mapping of salinity diffusion5.8.4 Dynamic monitoring of nanoparticle concentration profiles5.8.5 Unveiling the fingerprints of nanocrystalline self-assembly5.8.6 Near-wall thermometry 6. Reflection Interference Contrast Microscopy (RICM)6.1 Interference of plane waves6.2 Principles and practical issues of RICM6.3 Near-field applications of RICM6.3.1 Thin-film thickness measurements6.3.2 Electrohydrodynamic (EHD) control of thin liquid film6.3.3 Dynamic fingerprinting of live-cell focal contacts References6.3 Near-field applications of RICM6.3.1 Thin-film thickness measurements6.3.2 Electrohydrodynamic (EHD) control of thin liquid film6.3.3 Dynamic fingerprinting of live-cell focal contacts References
Series Title: Experimental fluid mechanics.
Responsibility: Kenneth D. Kihm.

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Primary Entity

<http://www.worldcat.org/oclc/727704156> # Near-field characterization of micro/nano-scaled fluid flows
    a schema:CreativeWork, schema:Book ;
   library:oclcnum "727704156" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/901066119#Place/berlin> ; # Berlin
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/gw> ;
   schema:about <http://id.worldcat.org/fast/1020062> ; # Microscopy
   schema:about <http://id.worldcat.org/fast/927999> ; # Fluid mechanics
   schema:bookFormat bgn:PrintBook ;
   schema:copyrightYear "2011" ;
   schema:creator <http://viaf.org/viaf/306126113> ; # Kenneth D. Kihm
   schema:datePublished "2011" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/901066119> ;
   schema:inLanguage "en" ;
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/901066119#Series/experimental_fluid_mechanics> ; # Experimental fluid mechanics.
   schema:name "Near-field characterization of micro/nano-scaled fluid flows"@en ;
   schema:productID "727704156" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/727704156#PublicationEvent/berlin_springer_verlag_2011> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/901066119#Agent/springer_verlag> ; # Springer-Verlag
   schema:workExample <http://worldcat.org/isbn/9783642204258> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/727704156> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/901066119#Agent/springer_verlag> # Springer-Verlag
    a bgn:Agent ;
   schema:name "Springer-Verlag" ;
    .

<http://experiment.worldcat.org/entity/work/data/901066119#Series/experimental_fluid_mechanics> # Experimental fluid mechanics.
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/727704156> ; # Near-field characterization of micro/nano-scaled fluid flows
   schema:name "Experimental fluid mechanics." ;
   schema:name "Experimental fluid mechanics" ;
    .

<http://id.worldcat.org/fast/1020062> # Microscopy
    a schema:Intangible ;
   schema:name "Microscopy"@en ;
    .

<http://id.worldcat.org/fast/927999> # Fluid mechanics
    a schema:Intangible ;
   schema:name "Fluid mechanics"@en ;
    .

<http://viaf.org/viaf/306126113> # Kenneth D. Kihm
    a schema:Person ;
   schema:familyName "Kihm" ;
   schema:givenName "Kenneth D." ;
   schema:name "Kenneth D. Kihm" ;
    .

<http://worldcat.org/isbn/9783642204258>
    a schema:ProductModel ;
   schema:isbn "3642204252" ;
   schema:isbn "9783642204258" ;
    .


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