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Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : February 2-4, 1993, Four Seasons Hotel, Austin, TX, USA.

Author: IEEE Components, Hybrids, and Manufacturing Technology Society.
Publisher: New York, NY, U.S.A. (345 E. 47th St., New York, NY 10017 U.S.A.) : IEEE ; Piscataway, NJ : Additional copies from IEEE Service Center, ©1993.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Austin (Tex., 1993)
Congresses
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: IEEE Components, Hybrids, and Manufacturing Technology Society.
ISBN: 0780308646 9780780308640 0780308638 9780780308633 0780308654 9780780308657
OCLC Number: 27691069
Notes: Sponsored by the IEEE Components, Hybrids, and Manufacturing Technology Society.
"IEEE catalog number 93CH3226-8"--Title page verso.
Description: x, 214 pages : illustrations ; 28 cm
Other Titles: Semiconductor Thermal Measurement and Management Symposium, 1993, SEMI-THERM IX, Ninth Annual IEEE.
9th Annual IEEE Semiconductor Thermal Measurement and Management Symposium
SEMI-THERM 1993

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Primary Entity

<http://www.worldcat.org/oclc/27691069> # Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : February 2-4, 1993, Four Seasons Hotel, Austin, TX, USA.
    a schema:CreativeWork, schema:Book ;
   library:oclcnum "27691069" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/1151750452#Place/piscataway_nj> ; # Piscataway, NJ
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nyu> ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/1151750452#Place/new_york_ny_u_s_a_345_e_47th_st_new_york_ny_10017_u_s_a> ; # New York, NY, U.S.A. (345 E. 47th St., New York, NY 10017 U.S.A.)
   rdfs:seeAlso <http://experiment.worldcat.org/entity/work/data/1151750452#CreativeWork/semiconductor_thermal_measurement_and_management_symposium_1993_semi_therm_ix_ninth_annual_ieee> ; # Semiconductor Thermal Measurement and Management Symposium, 1993, SEMI-THERM IX, Ninth Annual IEEE.
   schema:about <http://experiment.worldcat.org/entity/work/data/1151750452#Topic/conferences> ; # CONFERENCES
   schema:about <http://experiment.worldcat.org/entity/work/data/1151750452#Topic/amorphous_semiconductors> ; # AMORPHOUS SEMICONDUCTORS
   schema:about <http://experiment.worldcat.org/entity/work/data/1151750452#Topic/halbleiterbauelement> ; # Halbleiterbauelement
   schema:about <http://experiment.worldcat.org/entity/work/data/1151750452#Topic/semiconductors_materials> ; # SEMICONDUCTORS (MATERIALS)
   schema:about <http://experiment.worldcat.org/entity/work/data/1151750452#Topic/conductive_heat_transfer> ; # CONDUCTIVE HEAT TRANSFER
   schema:about <http://experiment.worldcat.org/entity/work/data/1151750452#Topic/thermische_belastung> ; # Thermische Belastung
   schema:about <http://id.loc.gov/authorities/subjects/sh85119907> ; # Semiconductors--Cooling
   schema:about <http://id.loc.gov/authorities/subjects/sh85119919> ; # Semiconductors--Thermal properties
   schema:about <http://experiment.worldcat.org/entity/work/data/1151750452#Topic/integrated_circuits> ; # INTEGRATED CIRCUITS
   schema:about <http://experiment.worldcat.org/entity/work/data/1151750452#Topic/thermodynamic_properties> ; # THERMODYNAMIC PROPERTIES
   schema:about <http://id.worldcat.org/fast/1112264> ; # Semiconductors--Thermal properties
   schema:about <http://experiment.worldcat.org/entity/work/data/1151750452#Topic/messung> ; # Messung
   schema:about <http://experiment.worldcat.org/entity/work/data/1151750452#Topic/kongress> ; # Kongreß
   schema:about <http://id.worldcat.org/fast/1112209> ; # Semiconductors--Cooling
   schema:about <http://dewey.info/class/621.38152/e20/> ;
   schema:alternateName "9th Annual IEEE Semiconductor Thermal Measurement and Management Symposium" ;
   schema:alternateName "SEMI-THERM 1993" ;
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://viaf.org/viaf/132055631> ; # IEEE Components, Hybrids, and Manufacturing Technology Society.
   schema:copyrightYear "1993" ;
   schema:creator <http://experiment.worldcat.org/entity/work/data/1151750452#Meeting/ieee_semiconductor_thermal_measurement_and_management_symposium_9th_1993_austin_tex> ; # IEEE Semiconductor Thermal Measurement and Management Symposium (9th : 1993 : Austin, Tex.)
   schema:datePublished "1993" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/1151750452> ;
   schema:genre "Austin (Tex., 1993)"@en ;
   schema:genre "Conference papers and proceedings"@en ;
   schema:genre "Conference publication"@en ;
   schema:inLanguage "en" ;
   schema:name "Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : February 2-4, 1993, Four Seasons Hotel, Austin, TX, USA."@en ;
   schema:productID "27691069" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/27691069#PublicationEvent/new_york_ny_u_s_a_345_e_47th_st_new_york_ny_10017_u_s_a_ieee_piscataway_nj_additional_copies_from_ieee_service_center_1993> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/1151750452#Agent/additional_copies_from_ieee_service_center> ; # Additional copies from IEEE Service Center
   schema:publisher <http://experiment.worldcat.org/entity/work/data/1151750452#Agent/ieee> ; # IEEE
   schema:url <http://ieeexplore.ieee.org/servlet/opac?punumber=683> ;
   schema:url <http://www.gbv.de/dms/bowker/toc/9780780308633.pdf> ;
   schema:url <http://www.ieeexplore.ieee.org/servlet/opac?punumber=683> ;
   schema:workExample <http://worldcat.org/isbn/9780780308657> ;
   schema:workExample <http://worldcat.org/isbn/9780780308640> ;
   schema:workExample <http://worldcat.org/isbn/9780780308633> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/27691069> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/1151750452#Agent/additional_copies_from_ieee_service_center> # Additional copies from IEEE Service Center
    a bgn:Agent ;
   schema:name "Additional copies from IEEE Service Center" ;
    .

<http://experiment.worldcat.org/entity/work/data/1151750452#CreativeWork/semiconductor_thermal_measurement_and_management_symposium_1993_semi_therm_ix_ninth_annual_ieee> # Semiconductor Thermal Measurement and Management Symposium, 1993, SEMI-THERM IX, Ninth Annual IEEE.
    a schema:CreativeWork ;
   schema:name "Semiconductor Thermal Measurement and Management Symposium, 1993, SEMI-THERM IX, Ninth Annual IEEE." ;
    .

<http://experiment.worldcat.org/entity/work/data/1151750452#Meeting/ieee_semiconductor_thermal_measurement_and_management_symposium_9th_1993_austin_tex> # IEEE Semiconductor Thermal Measurement and Management Symposium (9th : 1993 : Austin, Tex.)
    a bgn:Meeting, schema:Event ;
   schema:location <http://experiment.worldcat.org/entity/work/data/1151750452#Place/austin_tex> ; # Austin, Tex.)
   schema:name "IEEE Semiconductor Thermal Measurement and Management Symposium (9th : 1993 : Austin, Tex.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/1151750452#Place/new_york_ny_u_s_a_345_e_47th_st_new_york_ny_10017_u_s_a> # New York, NY, U.S.A. (345 E. 47th St., New York, NY 10017 U.S.A.)
    a schema:Place ;
   schema:name "New York, NY, U.S.A. (345 E. 47th St., New York, NY 10017 U.S.A.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/1151750452#Topic/amorphous_semiconductors> # AMORPHOUS SEMICONDUCTORS
    a schema:Intangible ;
   schema:name "AMORPHOUS SEMICONDUCTORS"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/1151750452#Topic/conductive_heat_transfer> # CONDUCTIVE HEAT TRANSFER
    a schema:Intangible ;
   schema:name "CONDUCTIVE HEAT TRANSFER"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/1151750452#Topic/halbleiterbauelement> # Halbleiterbauelement
    a schema:Intangible ;
   schema:name "Halbleiterbauelement"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/1151750452#Topic/integrated_circuits> # INTEGRATED CIRCUITS
    a schema:Intangible ;
   schema:name "INTEGRATED CIRCUITS"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/1151750452#Topic/semiconductors_materials> # SEMICONDUCTORS (MATERIALS)
    a schema:Intangible ;
   schema:name "SEMICONDUCTORS (MATERIALS)"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/1151750452#Topic/thermische_belastung> # Thermische Belastung
    a schema:Intangible ;
   schema:name "Thermische Belastung"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/1151750452#Topic/thermodynamic_properties> # THERMODYNAMIC PROPERTIES
    a schema:Intangible ;
   schema:name "THERMODYNAMIC PROPERTIES"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh85119907> # Semiconductors--Cooling
    a schema:Intangible ;
   schema:name "Semiconductors--Cooling"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh85119919> # Semiconductors--Thermal properties
    a schema:Intangible ;
   schema:name "Semiconductors--Thermal properties"@en ;
    .

<http://id.worldcat.org/fast/1112209> # Semiconductors--Cooling
    a schema:Intangible ;
   schema:name "Semiconductors--Cooling"@en ;
    .

<http://id.worldcat.org/fast/1112264> # Semiconductors--Thermal properties
    a schema:Intangible ;
   schema:name "Semiconductors--Thermal properties"@en ;
    .

<http://viaf.org/viaf/132055631> # IEEE Components, Hybrids, and Manufacturing Technology Society.
    a schema:Organization ;
   schema:name "IEEE Components, Hybrids, and Manufacturing Technology Society." ;
    .

<http://worldcat.org/isbn/9780780308633>
    a schema:ProductModel ;
   schema:isbn "0780308638" ;
   schema:isbn "9780780308633" ;
    .

<http://worldcat.org/isbn/9780780308640>
    a schema:ProductModel ;
   schema:isbn "0780308646" ;
   schema:isbn "9780780308640" ;
    .

<http://worldcat.org/isbn/9780780308657>
    a schema:ProductModel ;
   schema:isbn "0780308654" ;
   schema:isbn "9780780308657" ;
    .

<http://www.worldcat.org/title/-/oclc/27691069>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
   schema:about <http://www.worldcat.org/oclc/27691069> ; # Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : February 2-4, 1993, Four Seasons Hotel, Austin, TX, USA.
   schema:dateModified "2018-03-10" ;
   void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .

<http://www.worldcat.org/title/-/oclc/27691069#PublicationEvent/new_york_ny_u_s_a_345_e_47th_st_new_york_ny_10017_u_s_a_ieee_piscataway_nj_additional_copies_from_ieee_service_center_1993>
    a schema:PublicationEvent ;
   schema:location <http://experiment.worldcat.org/entity/work/data/1151750452#Place/piscataway_nj> ; # Piscataway, NJ
   schema:location <http://experiment.worldcat.org/entity/work/data/1151750452#Place/new_york_ny_u_s_a_345_e_47th_st_new_york_ny_10017_u_s_a> ; # New York, NY, U.S.A. (345 E. 47th St., New York, NY 10017 U.S.A.)
   schema:organizer <http://experiment.worldcat.org/entity/work/data/1151750452#Agent/additional_copies_from_ieee_service_center> ; # Additional copies from IEEE Service Center
   schema:organizer <http://experiment.worldcat.org/entity/work/data/1151750452#Agent/ieee> ; # IEEE
    .


Content-negotiable representations

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