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Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : February 2-4, 1993, Four Seasons Hotel, Austin, TX, USA.

Author: IEEE Components, Hybrids, and Manufacturing Technology Society.
Publisher: New York, NY, U.S.A. (345 E. 47th St., New York, NY 10017 U.S.A.) : IEEE ; Piscataway, NJ : Additional copies from IEEE Service Center, ©1993.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
IEEE Semiconductor Thermal Measurement and Management Symposium (9th : 1993 : Austin, Tex.).
Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium.
New York, NY, U.S.A. (345 E. 47th St., New York, NY 10017 U.S.A.) : IEEE ; Piscataway, NJ : Additional copies from IEEE Service Center, ©1993
(OCoLC)27691069
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: IEEE Components, Hybrids, and Manufacturing Technology Society.
OCLC Number: 47882930
Notes: Sponsored by the IEEE Components, Hybrids, and Manufacturing Technology Society.
"IEEE catalog number 93CH3226-8"--Title page verso.
Description: 1 online resource (x, 214 pages) : illustrations
Other Titles: 9th Annual IEEE Semiconductor Thermal Measurement and Management Symposium
SEMI-THERM 1993
Semiconductor Thermal Measurement and Management Symposium, 1993, SEMI-THERM IX, Ninth Annual IEEE

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