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Noise and information in nanoelectronics, sensors, and standards II : 26-28 May, 2004, Maspalomas, Gran Canaria, Spain

Author: Janusz M Smulko; Society of Photo-optical Instrumentation Engineers.; Sociedad Española de Optica.; SPIE Digital Library.
Publisher: Bellingham, Wash. : SPIE, ©2004.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 5472.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
Noise and information in nanoelectronics, sensors, and standards II.
Bellingham, Wash. : SPIE, ©2004
(OCoLC)56038044
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Janusz M Smulko; Society of Photo-optical Instrumentation Engineers.; Sociedad Española de Optica.; SPIE Digital Library.
OCLC Number: 56882688
Description: 1 online resource (xxi, 442 pages) : illustrations.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 5472.
Responsibility: Janusz M. Smulko [and others], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization, SEDO--Sociedad Española de Óptica (Spain).

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