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Noise and information in nanoelectronics, sensors, and standards III : 24-26 May 2005, Austin, Texas, USA

Author: János A Bergou; Society of Photo-optical Instrumentation Engineers.; SPIE Digital Library.
Publisher: Bellingham, Wash. : SPIE, ©2005.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 5846.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Summary:

Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: (OCoLC)61189486
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: János A Bergou; Society of Photo-optical Instrumentation Engineers.; SPIE Digital Library.
ISBN: 0819458414 9780819458414
OCLC Number: 61190792
Reproduction Notes: Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2005. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.
Description: xxiv, 210 pages : illustrations ; 28 cm.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 5846.
Responsibility: aJ́nos A. Bergou [and others], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

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