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Novel algorithms for fast statistical analysis of scaled circuits

Author: Amith Singhee; Rob A Rutenbar
Publisher: Dordrecht ; New York : Springer, ©2009.
Series: Lecture notes in electrical engineering, v. 46.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Database:WorldCat
Summary:
As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably  Read more...
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Genre/Form: Electronic books
Additional Physical Format: Print version:
Singhee, Amith.
Novel algorithms for fast statistical analysis of scaled circuits.
Doredrecht ; New York : Springer, ©2009
(OCoLC)428029969
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Amith Singhee; Rob A Rutenbar
ISBN: 9789048131006 9048131006
OCLC Number: 458562851
Description: 1 online resource (xv, 195 pages) : illustrations.
Contents: SiLVR: projection pursuit for response surface modeling --
Quasi-Monte Carlo for fast statistical simulation of circuits --
Statistical blockade: estimating rare event statistics --
Concluding observations.
Series Title: Lecture notes in electrical engineering, v. 46.
Responsibility: Amith Singhee, Rob A. Rutenbar.
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Abstract:

This book presents novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime. It draws on theories from a wide variety of scientific fields and applies them to  Read more...

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The Statistical Blockade method proposed by Singhee and Rutenbar will make a significant impact on the design of next-generation digital integrated circuits. It has the potential to dramatically Read more...

 
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