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Optical constants of materials for UV to X-ray wavelengths : 4-5 August, 2004, Denver, Colorado, USA

Author: John F Seely; Regina Soufli; Society of Photo-optical Instrumentation Engineers.
Publisher: Bellingham, Wash. : SPIE, ©2004.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 5538.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Congresses
Additional Physical Format: Online version:
Optical constants of materials for UV to X-ray wavelengths.
Bellingham, Wash. : SPIE, ©2004
(OCoLC)607358149
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: John F Seely; Regina Soufli; Society of Photo-optical Instrumentation Engineers.
ISBN: 0819454761 9780819454768
OCLC Number: 57119911
Notes: This conference was part of the program on X-Ray Systems and Technologies at SPIE's 49th Annual Meeting in Denver, Colorado.
Description: x, 172 pages : illustrations ; 28 cm.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 5538.
Responsibility: Regina Soufli, John F. Seely, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

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